Electrical characterization of Si doped AlN films synthesized by pulsed laser deposition

2015 ◽  
Vol 70 (1) ◽  
pp. 10102
Author(s):  
Simeon Simeonov ◽  
Silvia Bakalova ◽  
Anna Szekeres ◽  
Ivaylo Minkov ◽  
Gabriel Socol ◽  
...  
2010 ◽  
Author(s):  
K. Rodrigo ◽  
S. Heiroth ◽  
M. Lundberg ◽  
N. Bonanos ◽  
K. Mohan Kant ◽  
...  

2013 ◽  
Vol 860-863 ◽  
pp. 807-811
Author(s):  
Wen De Liu ◽  
Zhen Feng Kang ◽  
Qiang Li ◽  
Ping Ping Zheng ◽  
Tie Zhu Ding

This study is focused on the elaboration of 8 mol.% yttria stabilized zirconia (YSZ) thin films onto porous supporting NiOYSZ anode substrates using pulsed laser deposition (PLD),and their microstructural and electrical characterizations. Better crystallinity and grain connectivity is observed increasing the deposition temperature until best values are obtained at 500°C. The greater relative conductivity enhancement is found at 300-500°C. The observed an increased conductivity at lower temperatures may be caused by a combination of nanoscaled effect of the YSZ thin film and interfacial effects between YSZ thin film and substrate.


2012 ◽  
Vol 520 (21) ◽  
pp. 6531-6534 ◽  
Author(s):  
Einar Vøllestad ◽  
Agnieszka Gorzkowska-Sobas ◽  
Reidar Haugsrud

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