Time‐of‐flight measurement of electron velocity in an In0.52Al0.48As/In0.53Ga0.47As /In0.52Al0.48As double heterostructure
2014 ◽
Vol 4
(6)
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pp. 1518-1525
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2013 ◽
Vol 425
(12)
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pp. 122009
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2017 ◽
Vol 60
(4)
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pp. 556-561
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