scholarly journals Erratum: “Annealing-time dependence in interfacial reaction between poly-Si electrode and HfO2∕Si gate stack studied by synchrotron radiation photoemission and x-ray absorption spectroscopy” [Appl. Phys. Lett. 89, 012102 (2006)]

2006 ◽  
Vol 89 (16) ◽  
pp. 169902 ◽  
Author(s):  
H. Takahashi ◽  
J. Okabayashi ◽  
S. Toyoda ◽  
H. Kumigashira ◽  
M. Oshima ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Time Dependence ◽  
Interfacial Reaction ◽  
Absorption Spectroscopy ◽  
Annealing Time ◽  
Gate Stack ◽  
X Ray ◽  
X Ray Absorption ◽  
Synchrotron Radiation Photoemission

X-ray absorption spectroscopy and tunable color emission study of the Mn-co-doped BaAl2O4: Ce phosphor under synchrotron radiation

2019 ◽  
Vol 91 ◽  
pp. 401-407 ◽  
Author(s):  
Simone S. Melo ◽  
Adriano B. Andrade ◽  
Giordano F.C. Bispo ◽  
Jessica C. Carvalho ◽  
Zélia S. Macedo ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Absorption Spectroscopy ◽  
X Ray ◽  
Emission Study ◽  
X Ray Absorption ◽  
Co Doped ◽  
Color Emission
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