Determination of the I2 bond‐length distribution in liquid, solid and solution, by extended x‐ray absorption fine structure spectroscopy

1997 ◽  
Vol 107 (15) ◽  
pp. 5720-5726 ◽  
Author(s):  
U. Buontempo ◽  
A. Di Cicco ◽  
A. Filipponi ◽  
M. Nardone ◽  
P. Postorino
1992 ◽  
Vol 46 (15) ◽  
pp. 9869-9872 ◽  
Author(s):  
J. C. Woicik ◽  
T. Kendelewicz ◽  
K. E. Miyano ◽  
M. Richter ◽  
C. E. Bouldin ◽  
...  

The availability of intense, tunable, polarized X-radiation from electron storage rings has led to the successful application of surface extended X-ray absorption fine structure (s.e.X.a.f.s.) measurements to the determination of inter-atomic spacings and, by using multishell analyses, complete structures for adsorbates on surfaces. Recent work on a surface iodide structure on Ni{100}, Ag{100}— c (2 x 2) Cl, Ag{111}—(/ 3 x /3 ) R 30°—Cl (0.7 fractional monolayer coverage) and disordered 0.4 monolayer Ag{111}—Cl structure are reviewed. The results for Cl on Ag{100} confirm a previous exhaustive I.e.e d. intensity analysis for the same system, but yield greater precision in the Cl—Ag bond length (2.69 + 0.03 A). Studies of Cl on Ag{111} were extended to low crystal temperatures, and demonstrate: (i) a significant improvement in signal quality; (ii) removal of anomalies due to anharmonicity at room temperature; and (iii) the ability of s.e.X.a.f.s., by using a multishell data analysis procedure including four atomic shells, to provide an unambiguous structure determination from both a poorly ordered and a disordered structure. The Cl—Ag bond length is found to be 2.70 + 0.01 A at both 0.4 and 0.7 fractional monolayer coverages.


2005 ◽  
Vol 21 (7) ◽  
pp. 769-773 ◽  
Author(s):  
Masaki TAKAOKA ◽  
Satoshi FUKUTANI ◽  
Takashi YAMAMOTO ◽  
Masato HORIUCHI ◽  
Naoya SATTA ◽  
...  

2017 ◽  
Vol 259 ◽  
pp. 40-44 ◽  
Author(s):  
S.D. Singh ◽  
A.K. Poswal ◽  
C. Kamal ◽  
Parasmani Rajput ◽  
Aparna Chakrabarti ◽  
...  

2004 ◽  
Vol 831 ◽  
Author(s):  
V. Katchkanov ◽  
K.P. O'Donnell ◽  
J.F.W. Mosselmans ◽  
S. Hernandez ◽  
R.W. Martin ◽  
...  

ABSTRACTThe local structure around In atoms in InGaN epilayers grown by Molecular Beam Epitaxy (MBE) and by Metal-Organic Chemical Vapour Deposition (MOCVD) was studied by means of Extended X-ray Absorption Fine Structure (EXAFS). The averaged In fraction of MOCVD grown samples ranged from 10% to 40% as estimated by Electron Probe Microanalysis (EPMA). The In fraction of MBE grown samples spanned the range from 13% to 96%. The In–N bond length was found to vary slightly with composition, both for MBE and MOCVD grown samples. Moreover, for the same In content, the In-N bond lengths in MOCVD samples were longer than those in MBE grown samples. In contrast, the In-In radial separations in MOCVD and MBE samples were found to be indistinguishable for the same In molar fraction. The In-Ga bond length was observed to deviate from average cation-cation distance predicted by Vegard's law for MBE grown samples which indicates alloy compositional fluctuations.


1975 ◽  
Vol 11 (12) ◽  
pp. 4836-4846 ◽  
Author(s):  
E. A. Stern ◽  
D. E. Sayers ◽  
F. W. Lytle

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