An x‐ray diffraction line profile analysis on the microstructure of cold‐worked face‐centered‐cubic Cu‐Mn‐Si alloys: Effects of Mn and Si as solutes

1988 ◽  
Vol 64 (5) ◽  
pp. 2324-2327 ◽  
Author(s):  
S. K. Pradhan ◽  
M. De
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