An x‐ray diffraction line profile analysis on the microstructure of cold‐worked face‐centered‐cubic Cu‐Mn‐Si alloys: Effects of Mn and Si as solutes
Keyword(s):
X Ray
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An X-ray diffraction line profile analysis in cold- worked Fcc Ag-1Sn-Zn alloys: Role of 1 wt pct Sn
1990 ◽
Vol 21
(5)
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pp. 1327-1330
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Keyword(s):
X Ray
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1978 ◽
Vol 13
(8)
◽
pp. 1671-1679
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