Microhardness evaluation of Cu–Ni multilayered films by X-ray diffraction line profile analysis

1998 ◽  
Vol 324 (1-2) ◽  
pp. 162-164 ◽  
Author(s):  
F.L Shan ◽  
Z.M Gao ◽  
Y.M Wang
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Multilayered Films ◽  
X Ray ◽  
Diffraction Line Profile

scholarly journals X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material

2004 ◽  
Vol 27 (1) ◽  
pp. 59-67 ◽  
Author(s):  
K. Kapoor ◽  
D. Lahiri ◽  
S. V. R. Rao ◽  
T. Sanyal ◽  
B. P. Kashyap
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis

2001 ◽  
Vol 378-381 ◽  
pp. 753-758
Author(s):  
Alexandre Boulle ◽  
C. Legrand ◽  
P. Thomas ◽  
R. Guinebretière ◽  
J.P. Mercurio ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Stacking Disorder
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