Noise characterization and device parameter extraction of ap‐type strained layer quantum‐well infrared photodetector

1996 ◽  
Vol 79 (3) ◽  
pp. 1486-1490 ◽  
Author(s):  
Daniel C. Wang ◽  
Gijs Bosman ◽  
Sheng S. Li
1996 ◽  
Vol 68 (20) ◽  
pp. 2846-2848 ◽  
Author(s):  
T. R. Schimert ◽  
S. L. Barnes ◽  
A. J. Brouns ◽  
F. C. Case ◽  
P. Mitra ◽  
...  

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