Polycrystalline VO2 film characterization by quantum capacitance measurement

2015 ◽  
Vol 107 (10) ◽  
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Talbot Knighton ◽  
Vinicio Tarquini ◽  
David Torres ◽  
Tongyu Wang ◽  
...  
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Xiaolong Chen ◽  
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T. Nishimura ◽  
A. Toriumi

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