Electron spin resonance study of high field stressing in metal‐oxide‐silicon device oxides

1986 ◽  
Vol 49 (19) ◽  
pp. 1296-1298 ◽  
Author(s):  
W. L. Warren ◽  
P. M. Lenahan
1996 ◽  
Vol 100 (23) ◽  
pp. 9605-9609 ◽  
Author(s):  
Serge Gambarelli ◽  
Daniel Jaouen ◽  
André Rassat ◽  
Louis-Claude Brunel ◽  
Claude Chachaty

2009 ◽  
Vol 79 (2) ◽  
Author(s):  
T. Kashiwagi ◽  
M. Hagiwara ◽  
S. Kimura ◽  
Z. Honda ◽  
H. Miyazaki ◽  
...  

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