Electron spin resonance study of high field stressing in metal‐oxide‐silicon device oxides
1987 ◽
Vol 58
(22)
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pp. 2351-2354
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Keyword(s):
1996 ◽
Vol 100
(23)
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pp. 9605-9609
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1971 ◽
Vol 93
(25)
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pp. 6888-6890
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1987 ◽
Vol 36
(3)
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pp. 267-278
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