Charge collection efficiency in the presence of non-uniform carrier drift mobilities and lifetimes in photoconductive detectors
3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency
2013 ◽
Vol 8
(03)
◽
pp. C03023-C03023
◽
2016 ◽
Vol 55
(4)
◽
pp. 046401
◽