Correction of coupled higher-order modes in the S-parameter characterization of wideband cavity beam position monitors

2021 ◽  
Vol 92 (1) ◽  
pp. 014705
Author(s):  
Liu Yang ◽  
Xiaozhong He ◽  
Ruo Tang ◽  
Quanhong Long ◽  
Linwen Zhang
10.2172/72985 ◽  
1995 ◽  
Author(s):  
S.J. Russell ◽  
J.D. Gilpatrick ◽  
J.F. Power ◽  
R.B. Shurter

2017 ◽  
Vol 42 (17) ◽  
pp. 3343 ◽  
Author(s):  
Yao Xu ◽  
Guobin Ren ◽  
Youchao Jiang ◽  
Yixiao Gao ◽  
Haisu Li ◽  
...  

2019 ◽  
Vol 2019 ◽  
pp. 1-17 ◽  
Author(s):  
Raúl V. Haro-Báez ◽  
Juan Córcoles ◽  
Jorge A. Ruiz-Cruz ◽  
José R. Montejo-Garai ◽  
Jesús M. Rebollar

The characterization of the dielectric properties of a material requires a measurement technique and its associated analysis method. In this work, the configuration involving two coaxial probes with a material for dielectric measurement between them is analyzed with a mode-matching approach. To that effect, two models with different complexity and particularities are proposed. It will be shown how convergence is sped up for accurate results by using a proper choice of higher-order modes along with a combination of perfect electric wall and perfect magnetic wall boundary conditions. It will also be shown how the frequency response is affected by the flange mounting size, which can be, rigorously and efficiently, taken into account with the same type of approach. This numerical study is validated through a wide range of simulations with reference values from another method, showing how the proposed approaches can be used for the broadband characterization of this well-known, but with a recent renewed interest from the research community, dielectric measurement setup.


2014 ◽  
Vol 32 (23) ◽  
pp. 4534-4538 ◽  
Author(s):  
Du-Ri Song ◽  
Hee Su Park ◽  
Byoung Yoon Kim ◽  
Kwang Yong Song

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