Structural influence line analysis program based on python

The purpose of this paper is to investigate the application of Excel software in the constructing and plotting of influence lines in plane trusses. Obtaining the influence coefficient of the plane trusses with Excel, the influence lines in the plane trusses were constructed and plotted via VBA Functions in Excel. The research outcome of this paper is expected to be helpful to engineering practice, teaching and research work. Key words: EXCEL；plane trusses；influence line；VBA

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Java Applet For Teaching Influence Line Analysis

10.18260/1-2--10564 ◽

2020 ◽

Author(s):

Kamal Rojiani

Keyword(s):

Java Applet ◽

Influence Line ◽

Line Analysis

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A very rapid in situ Kikuchi technique to determine relative crystal misorientation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106211 ◽

1988 ◽

Vol 46 ◽

pp. 830-831

Author(s):

J. I. Bennetch

Keyword(s):

Electron Beam ◽

Analytical Techniques ◽

Superplastic Forming ◽

The Other ◽

Kikuchi Pattern ◽

Kikuchi Line ◽

Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

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