A very rapid in situ Kikuchi technique to determine relative crystal misorientation

1988 ◽  
Vol 46 ◽  
pp. 830-831
Author(s):  
J. I. Bennetch
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Superplastic Forming ◽  
The Other ◽  
Kikuchi Pattern ◽  
Kikuchi Line ◽  
Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

scholarly journals Worth a Closer Look: Raman Spectra of Lead-Pipe Scale

Minerals ◽  
2021 ◽  
Vol 11 (10) ◽  
pp. 1047
Author(s):  
Jill Dill Pasteris ◽  
Yeunook Bae ◽  
Daniel E. Giammar ◽  
Sydney N. Dybing ◽  
Claude H. Yoder ◽  
...  
Keyword(s):  
Cross Sections ◽  
Water System ◽  
Analytical Techniques ◽  
Real Time Analysis ◽  
Fiber Optic Probes ◽  
Lead Pipe ◽  
Lead Pipes ◽  
Non Destructive

The identification and characterization of lead-bearing and associated minerals in scales on lead pipes are essential to understanding and predicting the mobilization of lead into drinking water. Despite its long-recognized usefulness in the unambiguous identification of crystalline and amorphous solids, distinguishing between polymorphic phases, and rapid and non-destructive analysis on the micrometer spatial scale, the Raman spectroscopy (RS) technique has been applied only occasionally in the analysis of scales in lead service lines (LSLs). This article illustrates multiple applications of RS not just for the identification of phases, but also compositional and structural characterization of scale materials in harvested lead pipes and experimental pipe-loop/recirculation systems. RS is shown to be a sensitive monitor of these characteristics through analyses on cross-sections of lead pipes, raw interior pipe walls, particulates captured in filters, and scrapings from pipes. RS proves to be especially sensitive to the state of crystallinity of scale phases (important to their solubility) and to the specific chemistry of phases precipitated upon the introduction of orthophosphate to the water system. It can be used effectively alone as well as in conjunction with more standard analytical techniques. By means of fiber-optic probes, RS has potential for in situ, real-time analysis within water-filled pipes.

scholarly journals Growth and nanomechanical characterization of nanoscale 3D architectures grown via focused electron beam induced deposition

Nanoscale ◽  
2017 ◽  
Vol 9 (42) ◽  
pp. 16349-16356 ◽  
Author(s):  
Brett B. Lewis ◽  
Brittnee A. Mound ◽  
Bernadeta Srijanto ◽  
Jason D. Fowlkes ◽  
George M. Pharr ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Beam Induced Deposition ◽  
Scanning Electron

Nanomechanical measurements of platinum–carbon 3D nanoscale architectures grown via focused electron beam induced deposition (FEBID) were performed using a nanoindentation system in a scanning electron microscope (SEM) for simultaneous in situ imaging.

Resolution and Sensitivity of Electron Backscattered Diffraction in a Cold-Field Emission SEM

1996 ◽  
Vol 54 ◽  
pp. 360-361
Author(s):  
T.C. Isabell ◽  
V.P. Dravid
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Real Space ◽  
Lateral Resolution ◽  
X Ray Diffraction ◽  
Electron Backscattered Diffraction ◽  
Worst Case ◽  
Kikuchi Pattern ◽  
Implantation Damage ◽  
Identification Software

With the advent and development of automated beam control and pattern identification software, the use of electron backscattered diffraction (EBSD) as an analytical tool has increased in recent years. EBSD has been used to determine local crystallography and identification of phases, texturing of polyscrytalline materials, ion implantation damage and the extent of crystal deformation. X-ray diffraction yields crystallographic information, but with lateral resolution on the order of a millimeter. TEM provides local information with resolution of a few angstroms, but this is only over a small lateral region of electron transparency and with poor statistics. EBSD provides a true link between the local crystallographic data and real space information.The tradeoff between sensitivity and spatial resolution is inherent in all analytical techniques. EBSD is no exception, and determining this tradeoff for this technique is the focus of our work. In a specimen with minimal interfacial strains, as the electron beam is brought near a crystal boundary, the interaction volume of scattered electrons will straddle both crystals, resulting in an overlapped Kikuchi pattern on the imaging phosphor. By aligning such a boundary parallel to the incident electron beam, the “best case” lateral resolution of EBSD can be determined by taking patterns as the probe is stepped in known increments across the boundary. Likewise, the “worst case” resolution can be determined by orienting the boundary perpendicular to the electron beam and stepping the probe. These two cases are shown schematically in Figure 1.

AVO in North of Paria, Venezuela: Gas methane versus condensate reservoirs

Geophysics ◽  
1996 ◽  
Vol 61 (4) ◽  
pp. 937-946 ◽  
Author(s):  
José Regueiro ◽  
Andrés Peña
Keyword(s):  
Control Point ◽  
Gas Condensate ◽  
The Other ◽  
Fluid Density ◽  
Saturated Sands ◽  
Gas Fields

The gas fields of North of Paria, offshore eastern Venezuela, present a unique opportunity for amplitude variations with offset (AVO) characterization of reservoirs containing different fluids: gas‐condensate, gas (methane) and water (brine). AVO studies for two of the wells in the area, one with gas‐condensate and the other with gas (methane) saturated reservoirs, show interesting results. Water sands and a fluid contact (condensate‐water) are present in one of these wells, thus providing a control point on brine‐saturated properties. The reservoirs in the second well consist of sands highly saturated with mathane. Clear differences in AVO response exist between hydrocarbon‐saturated reservoirs and those containing brine. However, it is also interesting that “subtle” but noticeable differences can be interpreted between condensate‐and methane‐saturated sands. These differences are attributed to differences in both in‐situ fluid density and compressibility, and rock frame properties.

scholarly journals Study of mural paintings by Fulvio Pennacchi in São Paulo City by mineralogical techniques

2009 ◽  
Vol 81 (1) ◽  
pp. 115-126 ◽  
Author(s):  
Eliane A. Del Lama ◽  
Regina A. Tirello ◽  
Fábio R.D. de Andrade ◽  
Yushiro Kihara
Keyword(s):  
Uv Light ◽  
Energy Dispersive Spectrometer ◽  
Single Layer ◽  
Analytical Techniques ◽  
Sao Paulo ◽  
São Paulo ◽  
Mural Paintings ◽  
Made In

The present research deals with two mural paintings made in 1947 with the fresco technique by Fulvio Pennacchi in the Catholic Chapel of the Hospital das Clínicas (São Paulo City, Brazil), namely the Virgin Annunciation and the Supper at Emmaus. This study regards the materials and painting techniques used by the artist, based on historical research,on in situ observations and laboratory analytical techniques (stereomicroscopy,scanning electron microscopy with an energy dispersive spectrometer, X-ray diffractometry, electron microprobe, images obtained with UV-light), aiming to improve the methods of characterization of objects of our cultural heritage, and to enhance its preservation accordingly. The results lead to the identification of the plaster components and of distinct layers in the frescoes, besides further information on grain size, impurities and textures, composition of pigments, and features of deterioration, such as efflorescences. The degree of degradation of the murals painting was assessed by this way. Our data suggest that a single layer of plaster was used by Pennacchi, as a common mortar with fine- and medium-grained aggregates. Differences in texture were obtained by adding gypsum to the plaster.

scholarly journals Investigation of glazed pottery fragments (XIX century A. D.) from Agsu site (Azerbaijan) by XRF and Raman techniques

2020 ◽  
Vol 230 ◽  
pp. 00012
Author(s):  
Valentina Venuti ◽  
Vincenza Crupi ◽  
Barbara Fazio ◽  
Giuseppe Paladini ◽  
Mauro Francesco La Russa ◽  
...  
Keyword(s):  
Spatial Scales ◽  
Archaeological Site ◽  
The Other ◽  
Portable Instrument ◽  
X Ray ◽  
The Past ◽  
Xix Century ◽  
Non Destructive

In this study a multi-technique analysis was performed on the decorated surfaces of four ancient pottery fragments dated back XIX century A.D. withdrawn from the archaeological site of the medieval Agsu town, in Azerbaijan. During the last decade, the site underwent to an extensively archaeometric investigation by means of different non-destructive, or micro-destructive, techniques. In this work we focused our attention on the characterization of the pigmenting agents and glazes at different spatial scales from elemental to microscopic domain by using portable and not-portable equipments. In particular, the elemental and molecular compositions were successfully determined by X-ray fluorescence (XRF) and Raman spectroscopy, respectively. On one side, data deriving from portable instrument were compared with those previously obtained from not-portable approach, in view of future in situ investigations. On the other side, the overall obtained results appear crucial for the reconstruction of the production technology used by craftsman of the past.

Pulsed electron beam facility GESA-SOFIE for in-situ characterization of cathode plasma dynamics

Vacuum ◽  
2017 ◽  
Vol 145 ◽  
pp. 179-185 ◽  
Author(s):  
Renate Fetzer ◽  
Wladimir An ◽  
Alfons Weisenburger ◽  
Georg Mueller
Keyword(s):  
Electron Beam ◽  
In Situ Characterization ◽  
Cathode Plasma ◽  
Plasma Dynamics ◽  
Pulsed Electron Beam

Synthesis and Characterization of Hydrocarbon Coating Prepared by in Situ Electron Beam Deposition on ZnSe Nanowire

2008 ◽  
Vol 112 (20) ◽  
pp. 7572-7578 ◽  
Author(s):  
Y. G. Wang ◽  
B. S. Zuo ◽  
T. H. Wang ◽  
N. Wang ◽  
Z. C. Luo ◽  
...  
Keyword(s):  
Electron Beam ◽  
Synthesis And Characterization ◽  
Electron Beam Deposition ◽  
Beam Deposition

Sem-Based Characterization Techniques

1986 ◽  
Vol 69 ◽  
Author(s):  
Phillip E. Russell
Keyword(s):  
Electron Beam ◽  
Imaging System ◽  
Semiconductor Industry ◽  
Analytical Techniques ◽  
Materials Characterization ◽  
X Ray ◽  
Electron Beam Induced Current ◽  
Topographic Imaging

AbstractThe scanning electron microscope is now a common instrument in materials characterization laboratories. The basic role of the SEM as a topographic imaging system has steadily been expanding to include a wide variety of SEM-based analytical techniques. These techniques cover the range of basic semiconductor materials characterization to live-time device characterization of operating LSI or VLSI devices. This paper will introduce many of the more commonly used techniques, describe the modifications or additions to a conventional SEM required to utilize the techniques, and give examples of the use of such techniques. First, the types of signals available from a sample being irradiated by an electron beam will be reviewed. Then, where applicable, the type of spectroscopy or microscopy which has evolved to utilize the various signal types will be described. This will be followed by specific examples of the use of such techniques to solve problems related to semiconductor technology. Techniques to be emphasized will include: x-ray fluorescence spectroscopy, electron beam induced current (EBIC), stroboscopic voltage analysis, cathodoluminescence and electron beam IC metrology. Current and future trends of some of these techniques, as related to the semiconductor industry, will be discussed.

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