scholarly journals Bayesian sparse modeling of extended x-ray absorption fine structure to determine interstitial oxygen positions in yttrium oxyhydride epitaxial thin film

AIP Advances ◽  
2021 ◽  
Vol 11 (12) ◽  
pp. 125013
Author(s):  
Hiroyuki Kumazoe ◽  
Yasuhiko Igarashi ◽  
Fabio Iesari ◽  
Ryota Shimizu ◽  
Yuya Komatsu ◽  
...  
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
Interstitial Oxygen ◽  
Epitaxial Thin Film ◽  
Sparse Modeling ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Optical Properties and X-ray Absorption Fine Structure Analysis of ZnS:Cu,Cl Thin-Film Phosphors

2010 ◽  
Vol 49 (8) ◽  
pp. 082602 ◽  
Author(s):  
Kunio Ichino ◽  
Haruki Kato ◽  
Yuichiro Sakai ◽  
Koutoku Ohmi ◽  
Tetsuo Honma ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Properties ◽  
Fine Structure ◽  
Structure Analysis ◽  
X Ray ◽  
Absorption Fine ◽  
Fine Structure Analysis ◽  
X Ray Absorption

scholarly journals Application of Sparse Modeling to Extended X-ray Absorption Fine Structure Spectra of Transition Metals

2020 ◽  
Vol 89 (7) ◽  
pp. 074602
Author(s):  
Hiroyuki Setoyama ◽  
Ichiro Akai ◽  
Kazunori Iwamitsu ◽  
Yuuki Miyata ◽  
Sho Yakura ◽  
...  
Keyword(s):  
Fine Structure ◽  
Transition Metals ◽  
Sparse Modeling ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Refinement of free structure parameters of a thin film when only one reflection is available

2000 ◽  
Vol 33 (2) ◽  
pp. 252-258 ◽  
Author(s):  
Dirk C. Meyer ◽  
Peter Paufler
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
Energy Dependence ◽  
Epitaxial Layer ◽  
Structure Factor ◽  
Structure Parameters ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

A procedure is described to exploit measurements for the refinement of free structure parameters if only a few (or even only one) reflections are available. The method is illustrated taking an epitaxial layer of Ga0.5In0.5P deposited on (001)GaAs as an example, where the number of accessible reflections is limited by geometrical conditions. Another complication with this material arises from the well known ordering phenomenon, which occurred in a small part of the layer only. It is shown that the energy dependence of DAFS (diffraction anomalous fine structure) intensity is still sufficiently sensitive to values of free structure parameters when the oscillating part of the DAFS/XAFS (X-ray absorption fine structure) structure factor is ignored for evaluation of intensity. This facilitates evaluation of DAFS intensities considerably by avoiding time-consuming analysis of fine structure.

scholarly journals Sparse Modeling of an Extended X-Ray Absorption Fine-Structure Spectrum Based on a Single-Scattering Formalism

2018 ◽  
Vol 87 (7) ◽  
pp. 074003 ◽  
Author(s):  
Ichiro Akai ◽  
Kazunori Iwamitsu ◽  
Yasuhiko Igarashi ◽  
Masato Okada ◽  
Hiroyuki Setoyama ◽  
...  
Keyword(s):  
Fine Structure ◽  
Single Scattering ◽  
Sparse Modeling ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Fine Structure Spectrum ◽  
Structure Spectrum

Insituextended x‐ray absorption fine structure spectroscopy of thin‐film nickel hydroxide electrodes

1991 ◽  
Vol 58 (8) ◽  
pp. 865-867 ◽  
Author(s):  
T. W. Capehart ◽  
D. A. Corrigan ◽  
R. S. Conell ◽  
K. I. Pandya ◽  
R. W. Hoffman
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
Nickel Hydroxide ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

scholarly journals Analysis of Extended X-ray Absorption Fine Structure by Sparse Modeling

2020 ◽  
Vol 62 (1) ◽  
pp. 2-9
Author(s):  
Ichiro AKAI ◽  
Kazunori IWAMITSU ◽  
Yasuhiko IGARASHI ◽  
Masato OKADA ◽  
Hiroyuki SETOYAMA ◽  
...  
Keyword(s):  
Fine Structure ◽  
Sparse Modeling ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Study of α-Sexithienyl Thin Film by Polarized Near Edge X-ray Absorption Fine Structure

1996 ◽  
Vol 35 (Part 1, No. 5A) ◽  
pp. 2822-2825 ◽  
Author(s):  
Toshihiro Okajima ◽  
Satoru Narioka ◽  
Sachiko Tanimura ◽  
Kouji Hamano ◽  
Tetsuyuki Kurata ◽  
...  
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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