Fast high-resolution 3D total internal reflection fluorescence microscopy by incidence angle scanning and azimuthal averaging
2014 ◽
Vol 111
(48)
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pp. 17164-17169
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2012 ◽
Vol 17
(12)
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pp. 126007
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2009 ◽
Vol 26
(12)
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pp. 2550
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2007 ◽
Vol 26
(2)
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pp. 83-88
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2007 ◽
Vol 192
(2)
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pp. 303-307
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