Growth and Ferroelectric Characterization of Cerium-Modified Bismuth Titanate Thin Film Deposited on GaN Substrate by Pulsed Laser Deposition

2004 ◽  
Vol 66 (1) ◽  
pp. 253-260
Author(s):  
JAE-YEOL HWANG ◽  
CHAE-RYONG CHO ◽  
SANG-A LEE ◽  
SE-YOUNG JEONG ◽  
SOON-GIL YOON
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Bismuth Titanate ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Titanate Thin Film

Dielectric characterization of transparent epitaxial Ga2O3 thin film on n-GaN∕Al2O3 prepared by pulsed laser deposition

2006 ◽  
Vol 89 (18) ◽  
pp. 182906 ◽  
Author(s):  
Sang-A Lee ◽  
Jae-Yeol Hwang ◽  
Jong-Pil Kim ◽  
Se-Young Jeong ◽  
Chae-Ryong Cho
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Dielectric Characterization ◽  
Ga2o3 Thin Film

Preparation and Characterization of MFM and MFIS Structures Using Sr2(Ta1划x, Nbx)2O7 Thin Film by Pulsed Laser Deposition

2000 ◽  
Vol 655 ◽  
Author(s):  
Masanori Okuyama ◽  
Toshiyuki Nakaiso ◽  
Minoru Noda
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Ferroelectric Thin Films ◽  
Laser Deposition ◽  
Polarization Reversal ◽  
Ambient Gas ◽  
Mfis Structure

AbstractSr2(Ta1划x, Nbx)2O7(STN) ferroelectric thin films have been prepared on SiO2/Si(100) substrates by the pulsed laser deposition (PLD) method. Preferential (110) and (151)-oriented STN thin films are deposited at a low temperature of 600°C in N2O ambient gas at 0.08 Torr. A counterclockwise C-V hysteresis was observed in the metal-ferroelectric-insulator-semiconductor (MFIS) structure using Sr2(Ta0.7, Nb0.3)2O7 on SiO2/Si deposited at 600°C. Memory window in the C-V curve spreads symmetrically towards both positive and negative directions when applied voltage increases and the window does not change in sweep rates ranging from 0.1 to 4.0×103 V/s. The C-V curve of the MFIS structure does not degrade after 1010 cycles of polarization reversal. The gate retention time is about 3.0×103 sec when the voltages and time of write pulse are ±15V and 1.0 sec, respectively, and hold bias was -0.5 V.

Growth of lead titanate thin film waveguides by pulsed-laser deposition

2004 ◽  
Vol 453-454 ◽  
pp. 417-421 ◽  
Author(s):  
A. Roemer ◽  
A. Essahlaoui ◽  
O. Pons-Y-Moll ◽  
B. Vincent ◽  
R.M. Defourneau ◽  
...  
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Lead Titanate ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Thin Film Waveguides ◽  
Titanate Thin Film

Growth and characterization of LiNiVO4 thin film cathode by pulsed laser deposition

2008 ◽  
Vol 516 (8) ◽  
pp. 1693-1698 ◽  
Author(s):  
S.B. Tang ◽  
M.O. Lai ◽  
L. Lu
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition

Preparation and Characterization of BiFeO3 Thin Film Deposited on ITO Substrate by Using Pulsed Laser Deposition

2011 ◽  
Vol 59 (3(1)) ◽  
pp. 2537-2541 ◽  
Author(s):  
Jungmin Park ◽  
Fumiya Gotoda ◽  
Seiji Nakashima ◽  
Takeshi Kanashima ◽  
Masanori Okuyama
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Bifeo3 Thin Film

Pulsed Laser Deposition and Characterization of InZnO Alloyed Thin Film

2008 ◽  
pp. 308-311
Author(s):  
F.K. Shan ◽  
G.X. Liu ◽  
Byoung Chul Shin ◽  
Won Jae Lee ◽  
W.T. Oh
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition

Surface and texture characterization of thin-film ZnTe formed with pulsed-laser deposition

2006 ◽  
Vol 24 (4) ◽  
pp. 1623-1626 ◽  
Author(s):  
Artur Erlacher ◽  
Alejandra R. Lukaszew ◽  
Herbert Jaeger ◽  
Bruno Ullrich
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Texture Characterization

Electrical characterization of a-axis oriented Y123 thin film grown using pulsed laser deposition

2011 ◽  
Vol 11 (5) ◽  
pp. S79-S81 ◽  
Author(s):  
S. Saini ◽  
M. Takamura ◽  
M. Mukaida ◽  
S.-J. Kim
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Electrical Characterization ◽  
Laser Deposition
Sign in / Sign up

Export Citation Format

Share Document