scholarly journals Interference effects during the CO(1s−1π*) resonant excitation studied by polarization analysis of the CO+(A–X) fluorescence

2009 ◽  
Vol 194 (2) ◽  
pp. 022073
Author(s):  
Ph V Demekhin ◽  
I D Petrov ◽  
V L Sukhorukov ◽  
W Kielich ◽  
P Reiss ◽  
...  
Keyword(s):  
Resonant Excitation ◽  
Polarization Analysis ◽  
Interference Effects

Imaging magnetic microstructure with SEMPA

1993 ◽  
Vol 51 ◽  
pp. 1032-1033
Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Sandwich Structure ◽  
Magnetic Coupling ◽  
Polarization Analysis ◽  
Secondary Electrons ◽  
Magnetic Microstructure ◽  
Escape Depth ◽  
Scanning Electron

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.

Some Aspects of Exelfs Analysis in the Electron Microscope

1980 ◽  
Vol 38 ◽  
pp. 118-119
Author(s):  
D. E. Johnson ◽  
S. Csillag
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Energy Loss ◽  
Analytical Electron Microscopy ◽  
Interference Effects ◽  
Interatomic Distances ◽  
X Ray ◽  
Structure Information ◽  
Microanalytical Technique ◽  
Analytical Electron

Recently, the applications area of analytical electron microscopy has been extended to include the study of Extended Energy Loss Fine Structure (EXELFS). Modulations past an ionization edge in the energy loss spectrum (EXELFS), contain atomic fine structure information similar to Extended X-ray Absorbtion Fine Structure (EXAFS). At low momentum transfer the main contribution to these modulations comes from interference effects between the outgoing excited inner shell electron waves and electron waves backscattered from the surrounding atoms. The ability to obtain atomic fine structure information (such as interatomic distances) combined with the spatial resolution of an electron microscope is unique and makes EXELFS an important microanalytical technique.

Assessing Interference Effects Across Modalities: Print- Based Versus Auditory Stroop Conflicts

2012 ◽  
Author(s):  
Emily M. Elliott ◽  
Candice C. Morey ◽  
Richard D. Morey ◽  
Sharon D. Eaves ◽  
Jill T. Shelton ◽  
...  
Keyword(s):  
Interference Effects

Interference Effects of Angry Stimuli

2013 ◽  
Author(s):  
Dean G. Purcell ◽  
Alan L. Stewart
Keyword(s):  
Interference Effects

Interference Effects in Tone Memory

1975 ◽  
Author(s):  
Richard K. Olson ◽  
Vicki Hanson
Keyword(s):  
Interference Effects

Interference effects in Mössbauer relaxation spectra

1977 ◽  
Vol 38 (6) ◽  
pp. 691-696 ◽  
Author(s):  
F. Hartmann-Boutron ◽  
D. Spanjaard
Keyword(s):  
Interference Effects ◽  
Relaxation Spectra
Sign in / Sign up

Export Citation Format

Share Document