scholarly journals Extended reverse Monte Carlo method for extracting optical constants of thin Ni film from reflection electron energy-loss spectroscopy

2015 ◽  
Vol 635 (6) ◽  
pp. 062016
Author(s):  
H Xu ◽  
B Da ◽  
S F Mao ◽  
K Tőkési ◽  
Z J Ding
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Method ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Optical Constants ◽  
Reverse Monte Carlo ◽  
Electron Energy Loss ◽  
Reverse Monte Carlo Method
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