ABSTRACTThe order in self-assembled block copolymer films with hexagonal structure is compared using an image analysis method and images taken by scanning electron microscopy and atomic force microscopy. The coordinates of the centres of cylindrical elements in the assembled array are assigned using image analysis software. The method is then used to calculate the amount of elements that symmetrically overlap with another element when mapped through an origin point. Order is compared based on a single numerical value which is dependent on radial distance from the origin and the overlap tolerance value that is assigned. Samples of PS-b-PEO diblock copolymer with a range of molecular weights are compared, and it is found that the degree of ordering achieved is not related to the size of the molecule.
In-Situ Reflectometry Observation on Structural Changes of Thin Self-Assembled Block Copolymer Films
