Particles in monolayers and thin liquid films

Surfactants ◽  
2019 ◽  
pp. 467-500
Author(s):  
Bob Aveyard
Keyword(s):  
Free Energy ◽  
Particle Surface ◽  
Line Tension ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Fluid Interfaces ◽  
Free Energy Of Adsorption ◽  
Three Phase ◽  
Oil Water ◽  
Particle Adsorption

Small particles can adsorb strongly at fluid interfaces and form monolayers which can be studied using a Langmuir trough. For sufficiently large particles the monolayers can be viewed microscopically. The driving force for particle adsorption is the concomitant removal of fluid/fluid interface. For very small adsorbed particles, the free energy of forming the three-phase contact line around particles (hence the line tension) may also contribute significantly to the free energy of adsorption. Adsorption can be enhanced by having areas of particle surface with different wettability (Janus particles). Monolayers have structures dependent on lateral interactions between particles; for particles at the oil/water interface, electrical repulsion through oil is often the dominant interaction, which can give rise to highly ordered monolayers. Adsorbed particles can either inhibit or facilitate the formation of stable thin liquid films, depending on particle wettability.

Dependence of the Contact Angle on Adsorption at the Solid-Liquid Interface

2010 ◽  
Author(s):  
C. A. Ward
Keyword(s):  
Surface Tension ◽  
Contact Angle ◽  
Pressure Range ◽  
Line Tension ◽  
Liquid Interface ◽  
Fluid Interfaces ◽  
Phase Line ◽  
Three Phase ◽  
Solid Liquid Interface ◽  
Solid Liquid

A method for determining the surface tension of solid-fluid interfaces has been proposed. For a given temperature and fluid-solid combination, these surface tensions are expressed in terms of material properties that can be determined by measuring the amount of vapor adsorbed on the solid surface as a function of xV, the ratio of the vapor-phase pressure to the saturation-vapor pressure. The thermodynamic concept of pressure is shown to be in conflict with that of continuum mechanics, but is supported experimentally. This approach leads to the prediction that the contact angle, θ, can only exist in a narrow pressure range and that in this pressure range, the solid-vapor surface tension is constant and equal to the surface tension of the liquid-vapor interface, γLV. The surface tension of the solid-liquid interface, γSL, may be expressed in terms of measurable properties, γLV and θ: γSL = γLV(1 − cosθ). The value of θ is predicted to depend on both the pressure in the liquid at the three-phase, line x3L, and the three-phase line curvature, Ccl. We examine these predictions using sessile water droplets on a polished Cu surface, maintained in a closed, constant volume, isothermal container. The value of θ is found to depend on the adsorption at the solid-liquid interface, nSL = nSL(x3L,Ccl). The predicted value of θ is compared with that measured, and found to be in close agreement, but no effect of line tension is found.

scholarly journals Reducing effects of particle adsorption to the air-water interface in cryoEM

2018 ◽  
Author(s):  
Alex J. Noble ◽  
Hui Wei ◽  
Venkata P. Dandey ◽  
Zhening Zhang ◽  
Clinton S. Potter ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Single Particle ◽  
Dwell Time ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Water Interface ◽  
Cryo Electron Microscopy ◽  
Air Water Interface ◽  
Protein Particles ◽  
Particle Adsorption

AbstractMost protein particles prepared in vitreous ice for single particle cryo-electron microscopy are adsorbed to air-water or substrate-water interfaces, potentially causing particles to adopt preferred orientations. Using the Spotiton robot and nanowire grids, we can significantly reduce air-water interface issues by decreasing the dwell time of particles in thin liquid films. We demonstrate this by using single particle cryoEM and cryoET on three biological samples.

Hydrodynamics of thin liquid films. Rate of expansion of the perimeter of the three-phase contact

1978 ◽  
Vol 63 (1) ◽  
pp. 166-168 ◽  
Author(s):  
Ivan Boyanov Ivanov ◽  
Dimiter Stanchev Dimitrov ◽  
Borian Pencov Radoev
Keyword(s):  
Liquid Films ◽  
Thin Liquid Films ◽  
Phase Contact ◽  
Three Phase
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