High-fidelity method for a single-step
N
-bit Toffoli gate in trapped ions
2003 ◽
Vol 320
(2-3)
◽
pp. 131-139
◽
2015 ◽
Vol 29
(09)
◽
pp. 1550032
◽
Keyword(s):
2009 ◽
Vol 07
(03)
◽
pp. 669-680