High-resolution study of the x-ray resonant Raman scattering process around the1sabsorption edge for aluminium, silicon, and their oxides
Keyword(s):
X Ray
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1995 ◽
Vol 74
(18)
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pp. 3700-3703
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2002 ◽
Vol 189
(1-4)
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pp. 43-48
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2009 ◽
Vol 267
(2)
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pp. 221-225
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1996 ◽
Vol 54
(22)
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pp. 16010-16023
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