Structural studies of amorphous titanium diboride thin films by extended x-ray-absorption fine-structure and extended electron-energy-loss fine-structure techniques

Alain E. Kaloyeros; Mark P. Hoffman; Wendell S. Williams; Alex E. Greene; Joyce A. McMillan

doi:10.1103/physrevb.38.7333

Structural studies of amorphous titanium diboride thin films by extended x-ray-absorption fine-structure and extended electron-energy-loss fine-structure techniques

Physical Review B ◽

10.1103/physrevb.38.7333 ◽

1988 ◽

Vol 38 (11) ◽

pp. 7333-7344 ◽

Cited By ~ 7

Author(s):

Alain E. Kaloyeros ◽

Mark P. Hoffman ◽

Wendell S. Williams ◽

Alex E. Greene ◽

Joyce A. McMillan

Keyword(s):

Thin Films ◽

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Titanium Diboride ◽

Structural Studies ◽

X Ray ◽

Absorption Fine ◽

Electron Energy Loss ◽

X Ray Absorption

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Structural study of amorphous hydrogenated and unhydrogenated titanium carbide thin films by extended x-ray-absorption fine structure and extended electron-energy-loss fine structure

Physical Review B ◽

10.1103/physrevb.37.771 ◽

1988 ◽

Vol 37 (2) ◽

pp. 771-784 ◽

Cited By ~ 15

Author(s):

Alain E. Kaloyeros ◽

Wendell S. Williams ◽

Frederick C. Brown ◽

Alex E. Greene ◽

John B. Woodhouse

Keyword(s):

Thin Films ◽

Fine Structure ◽

Energy Loss ◽

Titanium Carbide ◽

Electron Energy ◽

Structural Study ◽

X Ray ◽

Absorption Fine ◽

Electron Energy Loss ◽

X Ray Absorption

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Critical Compilation of Surface Structures Determined by Surface Extended X‐Ray Absorption Fine Structure (SEXAFS) and Surface Extended Electron Energy Loss Spectroscopy (SEELFS)

Journal of Physical and Chemical Reference Data ◽

10.1063/1.555912 ◽

1992 ◽

Vol 21 (1) ◽

pp. 123-156 ◽

Cited By ~ 6

Author(s):

Philip R. Watson

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Surface Structures ◽

Critical Compilation ◽

X Ray ◽

Absorption Fine ◽

Electron Energy Loss ◽

X Ray Absorption

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Core-hole effects on theoretical electron-energy-loss near-edge structure and near-edge x-ray absorption fine structure of MgO

Physical Review B ◽

10.1103/physrevb.61.2180 ◽

2000 ◽

Vol 61 (3) ◽

pp. 2180-2187 ◽

Cited By ~ 85

Author(s):

Teruyasu Mizoguchi ◽

Isao Tanaka ◽

Masato Yoshiya ◽

Fumiyasu Oba ◽

Kazuyoshi Ogasawara ◽

...

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Core Hole ◽

Edge Structure ◽

X Ray ◽

Absorption Fine ◽

Electron Energy Loss ◽

X Ray Absorption

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The spatial resolution of electron energy loss and x-ray absorption fine structure

Journal of Applied Physics ◽

10.1063/1.2960582 ◽

2008 ◽

Vol 104 (3) ◽

pp. 034906 ◽

Cited By ~ 7

Author(s):

Feng Wang ◽

Ray F. Egerton ◽

Marek Malac ◽

Robert A. McLeod ◽

M. Sergio Moreno

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Spatial Resolution ◽

X Ray ◽

Absorption Fine ◽

Electron Energy Loss ◽

X Ray Absorption

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First-principles calculations of electron-energy-loss near-edge structure and near-edge x-ray-absorption fine structure of BN polytypes using model clusters

Physical Review B ◽

10.1103/physrevb.60.4944 ◽

1999 ◽

Vol 60 (7) ◽

pp. 4944-4951 ◽

Cited By ~ 55

Author(s):

Isao Tanaka ◽

Hiroyuki Araki ◽

Masato Yoshiya ◽

Teruyasu Mizoguchi ◽

Kazuyoshi Ogasawara ◽

...

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

First Principles ◽

First Principles Calculations ◽

Edge Structure ◽

X Ray ◽

Absorption Fine ◽

Electron Energy Loss ◽

X Ray Absorption

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X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L3,2 edge

Journal of Applied Physics ◽

10.1063/1.1417997 ◽

2001 ◽

Vol 90 (12) ◽

pp. 6379-6383 ◽

Cited By ~ 15

Author(s):

X.-H. Sun ◽

Y.-H. Tang ◽

P. Zhang ◽

S. J. Naftel ◽

R. Sammynaiken ◽

...

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Silicon Nanowires ◽

Electron Energy Loss Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Absorption Fine ◽

Electron Energy Loss ◽

X Ray Absorption

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Extended x-ray-absorption and electron-energy-loss fine-structure studies of the local atomic structure of amorphous unhydrogenated and hydrogenated silicon carbide

Physical Review B ◽

10.1103/physrevb.38.13099 ◽

1988 ◽

Vol 38 (18) ◽

pp. 13099-13106 ◽

Cited By ~ 43

Author(s):

Alain E. Kaloyeros ◽

Richard B. Rizk ◽

John B. Woodhouse

Keyword(s):

Silicon Carbide ◽

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Atomic Structure ◽

Local Atomic Structure ◽

Hydrogenated Silicon ◽

X Ray ◽

Electron Energy Loss ◽

X Ray Absorption

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Study by Extended X-ray Absorption Fine Structure Technique and Microscopy of the Amorphous State of Titanium Diboride Thin Films

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1988.tb07564.x ◽

1988 ◽

Vol 71 (11) ◽

pp. 948-955 ◽

Cited By ~ 3

Author(s):

ALAIN E. KALOYEROS ◽

WENDELL S. WILLIAMS ◽

RICHARD B. RIZK ◽

FREDERICK C. BROWN ◽

ALEX E. GREENE

Keyword(s):

Thin Films ◽

Fine Structure ◽

Titanium Diboride ◽

Amorphous State ◽

X Ray ◽

Absorption Fine ◽

X Ray Absorption

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Comparison of the TiK extended fine structure obtained from electron energy loss spectroscopy and x-ray absorption spectroscopy

Ultramicroscopy ◽

10.1016/0304-3991(93)90004-h ◽

1993 ◽

Vol 50 (2) ◽

pp. 141-145 ◽

Cited By ~ 13

Author(s):

G. Blanche ◽

G. Hug ◽

M. Jaouen ◽

A.M. Flank

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

Absorption Spectroscopy ◽

Electron Energy Loss Spectroscopy ◽

X Ray ◽

Electron Energy Loss ◽

X Ray Absorption

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Comparison between extended x-ray-absorption and extended electron energy-loss fine-structure results above theM2,3edge of cobalt

Physical Review B ◽

10.1103/physrevb.32.7826 ◽

1985 ◽

Vol 32 (12) ◽

pp. 7826-7829 ◽

Cited By ~ 16

Author(s):

M. Fanfoni ◽

S. Modesti ◽

N. Motta ◽

M. De Crescenzi ◽

R. Rosei

Keyword(s):

Fine Structure ◽

Energy Loss ◽

Electron Energy ◽

X Ray ◽

Electron Energy Loss ◽

X Ray Absorption

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