scholarly journals Rietveld refinement guidelines

1999 ◽  
Vol 32 (1) ◽  
pp. 36-50 ◽  
Author(s):  
L. B. McCusker ◽  
R. B. Von Dreele ◽  
D. E. Cox ◽  
D. Louër ◽  
P. Scardi
Keyword(s):  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Shape Function ◽  
Structural Parameters ◽  
Structure Refinement ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Radiation Sources ◽  
Common Problems

A set of general guidelines for structure refinement using the Rietveld (whole-profile) method has been formulated by the International Union of Crystallography Commission on Powder Diffraction. The practical rather than the theoretical aspects of each step in a typical Rietveld refinement are discussed with a view to guiding newcomers in the field. The focus is on X-ray powder diffraction data collected on a laboratory instrument, but features specific to data from neutron (both constant-wavelength and time-of-flight) and synchrotron radiation sources are also addressed. The topics covered include (i) data collection, (ii) background contribution, (iii) peak-shape function, (iv) refinement of profile parameters, (v) Fourier analysis with powder diffraction data, (vi) refinement of structural parameters, (vii) use of geometric restraints, (viii) calculation of e.s.d.'s, (ix) interpretation ofRvalues and (x) some common problems and possible solutions.

Rietveld Refinement of the BaTiO3 from X-Ray Powder Diffraction

2009 ◽  
Vol 79-82 ◽  
pp. 593-596
Author(s):  
Feng Sun ◽  
Yan Sheng Yin
Keyword(s):  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structural Parameters ◽  
Ferroelectric Ceramic ◽  
Powder Diffraction Data ◽  
Ceramic Powders ◽  
Space Group ◽  
X Ray

The ferroelectric ceramic BaTiO3 was synthesized at 1000 °C for 5 h. The structure of the system under study was refined on the basis of X-ray powder diffraction data using the Rietveld method. The system crystallizes in the space group P4mm（99）. The refinement of instrumental and structural parameters led to reliable values for the Rp, Rwp and Rexp.We use the TOPAS software of Bruker AXS to refine this ceramic powders and show its conformation

Rietveld refinement of the crystal structures of hexagonal Y6Cr4+xAl43−x (x=2.57) and tetragonal YCr4−xAl8+x (x=1.22)

1995 ◽  
Vol 10 (2) ◽  
pp. 86-90 ◽  
Author(s):  
R. Černý ◽  
K. Yvon ◽  
T. I. Yanson ◽  
M. B. Manyako ◽  
O. I. Bodak
Keyword(s):  
Crystal Structures ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Structure Refinement ◽  
Powder Diffraction Data ◽  
Space Group ◽  
X Ray

Y6Cr4+xAl43−x (x = 2.57); space group P63/mcm, a = 10.8601(1) Å, c = 17.6783(3) Å, V= 1805.7(1) Å3, Z=2; isostructural to Yb6Cr4+xAl43−x, (x=1.76) with two aluminium sites partially occupied by chromium (44% and 27% Cr). YCr4−xAl8+x (x=1.22); space group I4/mmm, a = 9.0299(2) Å, c = 5.1208(2) Å, V=417.55(3) Å3, Z=2, disordered variant of CeMn4Al8 with one chromium site (8f) partially occupied by aluminium (33% Al); X-ray powder diffraction data were collected on a well-crystallized multiphase sample containing 43 wt.% of Y6Cr4+xAl43−x, 27 wt.% of Y2Cr8−xAl16+x, 16 wt.% of Al, 13 wt.% of YAl3, and traces of Y2O3. Structure refinement converged at Rwp = 2.0% and RB = 3.5, 3.6% resp. for a total of 78 parameters and 1190 reflections.

scholarly journals Rietveld Structure Refinement of the Stilbite Crystals from Deccan Traps (India) Using X-ray Powder Diffraction Data

2019 ◽  
Vol 70 (7) ◽  
pp. 2379-2384
Author(s):  
Gheorghe Branoiu ◽  
Ibrahim Ramadan
Keyword(s):  
Crystal Structure ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Structure Refinement ◽  
Deccan Traps ◽  
Western India ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Cell Parameters

The crystal structure of a spectacular sample of stilbite from Pune region located in the Deccan Traps (western India) has been refined using X-Ray powder diffraction data and the Rietveld method. The Rietveld refinement was carried out using the computer program Diffracplus TOPAS 4.1. The pseudo-Voigt (pV) profile function was used for the fit of the peaks. The Rietveld refinement of the analyzed sample in the space group C2/m (No.12): a=13.606 �, b=18.260 �, c=11.253 �, b=127.432�, Z=8, confirm the basic stilbite structure. The chemical composition of the stilbite crystals from Pune region (India) was determined by EDX analysis. The paper presents a new set of the unit cell parameters and fractional coordinates that define the stilbite crystal structure. The quality of the sample analyzed was pristine, the sample being collected from an association of apophyllite-stilbite crystals of centimetric dimensions.

scholarly journals Pressing the Limits of Rietveld Refinement

1988 ◽  
Vol 41 (2) ◽  
pp. 297 ◽  
Author(s):  
RA Young
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Structure Refinement ◽  
Site Occupancy ◽  
The Other ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Neutron Powder Diffraction Data ◽  
Refinement Method

Two examples are given, one with X-ray data and one with netltron data, of the determination of structural detail which appear to be at the edge of current possibility for the Rietveld structure-refinement method. In the first example, 2�2 wt% Sb substituted in CalO(P04)6F2 was located. X-ray powder diffraction data collected with special attention to intensity precision and scale constancy were used. The problem was solved through comparison of intra-sample site-occupancy ratios between Sb-doped and undoped samples. In the second example, high quality, high resolution neutron powder diffraction data were required. The problem was to distinguish between two subtly different models of kaolinite for which the R-weighted-pattern values differed only by 2 or 3 units in the third digit and, particularly, to understand the basis for the consistent programmatic choice of one of the models (PI) over the other. The answer was found in the calculated and 'observed' intensities for (h+ k)-odd reflections; although they were very small, less than 1% of the intensities of the main reflections, many of them were distinctly nonzero. Even though these reflections were not separately observable, because of overlap and small size, they nonetheless correlated with one model sufficiently better than the other to produce the consistent choice.

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method

1995 ◽  
Vol 39 ◽  
pp. 515-521
Author(s):  
Kenneth B. Schwartz ◽  
Robert B. Von Dreele
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
High Density Polyethylene ◽  
Rietveld Method ◽  
Structure Refinement ◽  
High Density ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Voigt Profile ◽  
Full Structure

A full structure analysis of a completely crystallized sample of high-density polyethylene (HDPE) has been achieved using x-ray powder diffraction data collected on a laboratory-based powder diffractometer. The structure refinement is performed using the Rietveld method and includes refinement of the carbon and hydrogen atomic positions and temperature factors. The C-C and C-H bond distances and the C-C-C bond angle along the polyethylene chain have been calculated from the refined atomic positions and are in very good agreement with previous experimental and modelling determinations. Evaluations of the pseudo-Voigt profile parameters for Lorentzian strain broadening and me Scherrer coefficient for Gaussian broadening yield reasonable values for microstrain and particle size for this sample. Refinement of the preferred orientation parameter indicates that the HDPE flakes consist of platy crystals or lamellae that are packed normal to the diffraction vector.

X-Ray Powder Diffraction Data and Crystal Refinement of Ternary Compound Ti4ZrSi3

2020 ◽  
Vol 841 ◽  
pp. 99-102
Author(s):  
Liu Qing Liang ◽  
Yan Ying Wei ◽  
De Gui Li
Keyword(s):  
Ternary Compound ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Structure Refinement ◽  
Structure Type ◽  
Hexagonal Structure ◽  
Powder Diffraction Data ◽  
Tungsten Electrode ◽  
X Ray

Ternary compound Ti4ZrSi3 was prepared by arc melting using a non-consumable tungsten electrode under argon atmosphere, then annealed at 1023K for 30 days, the X-ray powder diffraction data of Ti4ZrSi3 was collected on a Rigaku SmartLab X-ray powder diffractometer. The powder patterns of the compound were indexed and structure refinement by using Rietveld method indicate that the Ti4ZrSi3 compound crystallizes in the hexagonal structure, space group P6/mcm (No.193) with Mn5Si3 structure type, a=b=7.5759(3) Ǻ, c=5.2162(2) Ǻ, V=259.28Ǻ3, Z=2, ρx=4.779g cm-3, the Smith–Snyder FOM F30=148.7(0.0064, 46) and the intensity ratio RIR=1.37. The Rietveld refinement results were Rp = 0.0836, Rwp= 0.1092.

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