Simulating the diffraction line profile from nanocrystalline powders using a spherical harmonics expansion

2018 ◽  
Vol 74 (6) ◽  
pp. 640-646
Author(s):  
K. R. Beyerlein ◽  
P. Scardi
Keyword(s):  
Line Profile ◽  
Spherical Harmonics ◽  
Diffraction Line ◽  
Nanocrystalline Powders ◽  
Computationally Efficient ◽  
Profile Function ◽  
Diffraction Line Profile ◽  
Cubic Crystallites ◽  
Crystallite Shape ◽  
Spherical Harmonics Expansion

An accurate description of the diffraction line profile from nanocrystalline powders can be obtained by a spherical harmonics expansion of the profile function. The procedure outlined in this work is found to be computationally efficient and applicable to the line profile for any crystallite shape and size. Practical examples of the diffraction pattern peak profiles resulting from cubic crystallites between 1 and 100 nm in size are shown.

Microhardness evaluation of Cu–Ni multilayered films by X-ray diffraction line profile analysis

1998 ◽  
Vol 324 (1-2) ◽  
pp. 162-164 ◽  
Author(s):  
F.L Shan ◽  
Z.M Gao ◽  
Y.M Wang
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Multilayered Films ◽  
X Ray ◽  
Diffraction Line Profile

Diffraction line profile of a two-dimensional hexatic

1994 ◽  
Vol 73 (1) ◽  
pp. 102-105 ◽  
Author(s):  
I. R. Peterson ◽  
V. M. Kaganer
Keyword(s):  
Line Profile ◽  
Diffraction Line ◽  
Two Dimensional ◽  
Diffraction Line Profile

X-ray diffraction line profile analysis of diffusional homogenization in powder blends

1978 ◽  
Vol 13 (8) ◽  
pp. 1671-1679 ◽  
Author(s):  
R. Delhez ◽  
E. J. Mittemeijer ◽  
E. A. van den Bergen
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Powder Blends ◽  
Diffusional Homogenization

scholarly journals X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material

2004 ◽  
Vol 27 (1) ◽  
pp. 59-67 ◽  
Author(s):  
K. Kapoor ◽  
D. Lahiri ◽  
S. V. R. Rao ◽  
T. Sanyal ◽  
B. P. Kashyap
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis

2001 ◽  
Vol 378-381 ◽  
pp. 753-758
Author(s):  
Alexandre Boulle ◽  
C. Legrand ◽  
P. Thomas ◽  
R. Guinebretière ◽  
J.P. Mercurio ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Stacking Disorder
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