An application of automatic test equipment for detecting and identifying faults on printed circuit boards before functional testing

Circuit World ◽  
1975 ◽  
Vol 1 (4) ◽  
pp. 34-36
Author(s):  
R.S. Lester
2008 ◽  
Vol 128 (11) ◽  
pp. 657-662 ◽  
Author(s):  
Tsuyoshi Maeno ◽  
Yukihiko Sakurai ◽  
Takanori Unou ◽  
Kouji Ichikawa ◽  
Osamu Fujiwara

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