Electrical impedance tomography reconstruction through simulated annealing with total least square error as objective function
2016 ◽
Vol 72
(5)
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pp. 1230-1243
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2011 ◽
Vol 44
(1)
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pp. 4989-4994
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2012 ◽
Vol 407
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pp. 012015
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2016 ◽
Vol 52
(3)
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pp. 1-4
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1998 ◽
Vol 36
(4)
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pp. 395-398
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