Bias Generation and Calibration of CMOS Charge Qubits at 3.5 Kelvin in 22-nm FDSOI

Author(s):  
Imran Bashir ◽  
Dirk Leipold ◽  
Mike Asker ◽  
Ali Esmailiyan ◽  
Elena Blokhina ◽  
...  
Keyword(s):  
2009 ◽  
Vol 105 (8) ◽  
pp. 084504 ◽  
Author(s):  
M. Wenin ◽  
R. Roloff ◽  
W. Pötz
Keyword(s):  

2005 ◽  
Vol 72 (8) ◽  
Author(s):  
Tetsufumi Tanamoto ◽  
Shinobu Fujita
Keyword(s):  

2012 ◽  
Vol 45 (48) ◽  
pp. 485305 ◽  
Author(s):  
A-S F Obada ◽  
H A Hessian ◽  
A-B A Mohamed ◽  
Ali H Homid

2005 ◽  
Vol 426-431 ◽  
pp. 1552-1560 ◽  
Author(s):  
Yu.A. Pashkin ◽  
T. Yamamoto ◽  
O. Astafiev ◽  
Y. Nakamura ◽  
D.V. Averin ◽  
...  

2005 ◽  
Vol 19 (07n08) ◽  
pp. 371-378 ◽  
Author(s):  
XIAN-TING LIANG ◽  
YONG-JIAN XIONG

In this paper we calculate the loss of fidelity due to quantum leakage for the Josephson charge qubit (JCQ). In this investigation the characteristic values and characteristic states of the Mathieu equation are used. It is shown that for present typical parameters of JCQ, E J /E ch ~ 0.02, the loss of the fidelity per elementary operation is about 10-4 which satisfies DiVincenzo's low decoherence criterion. By appropriately improving the designs of the Josephson junction, namely, decreasing E J /E ch to ~ 0.01, the loss of fidelity per elementary operation can decrease even smaller to 10-5. The first-order nonadiabatic correction is also obtained by using the approach.


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