Extended firm mutation testing: A cost reduction technique for mutation testing

Author(s):  
Mayank Singh ◽  
Viranjay M. Srivastava
IEEE Software ◽  
2010 ◽  
Vol 27 (3) ◽  
pp. 80-86 ◽  
Author(s):  
Macario Polo Usaola ◽  
Pedro Reales Mateo

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