Embedded system is applied more and more extensively in the fields of national defense weapon equipment. With the increasing complexity of embedded systems, the combination of the hardware with software is more and closer. Because of the overall characteristic of hardware and software combination in embedded system, traditional reliability test can hardly accurately identify the reliability of embedded systems. The proposed combined reliability testing method, which combines software reliability test with system integrated environmental stress test to simulate the state of system running, provides the basis for the accurate validation and evaluation of reliability of embedded system.
