A Wafer Map Defect Pattern Classification Model Based on Deep Convolutional Neural Network

Author(s):  
Dong-Yang Du ◽  
Zheng Shi
2019 ◽  
Vol 75 (2) ◽  
pp. 160-166
Author(s):  
Kyuseok Kim ◽  
Woosoung Kim ◽  
Seokyoon Kang ◽  
Dongyeon Lee ◽  
Hyosung Cho ◽  
...  

2016 ◽  
Vol 35 (5) ◽  
pp. 1207-1216 ◽  
Author(s):  
Marios Anthimopoulos ◽  
Stergios Christodoulidis ◽  
Lukas Ebner ◽  
Andreas Christe ◽  
Stavroula Mougiakakou

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