Temporal Dimensionality Reduction for Land Cover Map Production Using High Resolution Image Time Series

2018 ◽  
Author(s):  
Jordi Inglanda ◽  
Cedric Traizet
Keyword(s):  
Time Series ◽  
High Resolution ◽  
Land Cover ◽  
Dimensionality Reduction ◽  
Resolution Image ◽  
High Resolution Image ◽  
Land Cover Map

scholarly journals Operational High Resolution Land Cover Map Production at the Country Scale Using Satellite Image Time Series

2017 ◽  
Vol 9 (1) ◽  
pp. 95 ◽  
Author(s):  
Jordi Inglada ◽  
Arthur Vincent ◽  
Marcela Arias ◽  
Benjamin Tardy ◽  
David Morin ◽  
...  
Keyword(s):  
Time Series ◽  
High Resolution ◽  
Land Cover ◽  
Satellite Image ◽  
Land Cover Map

Spatially detailed retrievals of spring phenology from single-season high-resolution image time series

2017 ◽  
Vol 59 ◽  
pp. 19-30 ◽  
Author(s):  
Anton Vrieling ◽  
Andrew K. Skidmore ◽  
Tiejun Wang ◽  
Michele Meroni ◽  
Bruno J. Ens ◽  
...  
Keyword(s):  
Time Series ◽  
High Resolution ◽  
Spring Phenology ◽  
Resolution Image ◽  
High Resolution Image

Radiation Damage, Contrast and Statistics in High Resolution Biological Electron Microscopy

1970 ◽  
Vol 28 ◽  
pp. 260-261
Author(s):  
Robert M. Glaeser
Keyword(s):  
High Resolution ◽  
Particle Flux ◽  
Unit Area ◽  
Signal To Noise ◽  
Resolution Image ◽  
High Resolution Image ◽  
Pass Through ◽  
Counting Statistics ◽  
The Relationship ◽  
Picture Element

It is well known that a large flux of electrons must pass through a specimen in order to obtain a high resolution image while a smaller particle flux is satisfactory for a low resolution image. The minimum particle flux that is required depends upon the contrast in the image and the signal-to-noise (S/N) ratio at which the data are considered acceptable. For a given S/N associated with statistical fluxtuations, the relationship between contrast and “counting statistics” is s131_eqn1, where C = contrast; r2 is the area of a picture element corresponding to the resolution, r; N is the number of electrons incident per unit area of the specimen; f is the fraction of electrons that contribute to formation of the image, relative to the total number of electrons incident upon the object.

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