Design and optimization of a low frequency electric field sensor using Pockels effect

Author(s):  
M. Passard ◽  
C. Barthod ◽  
M. Fortin ◽  
C. Galez ◽  
J. Bouillot
1991 ◽  
Vol 16 (18) ◽  
pp. 1445 ◽  
Author(s):  
S. T. Vohra ◽  
F. Bucholtz ◽  
A. D. Kersey

2019 ◽  
Vol 9 (9) ◽  
pp. 1951
Author(s):  
Shijun Xie ◽  
Yu Zhang ◽  
Huaiyuan Yang ◽  
Hao Yu ◽  
Zhou Mu ◽  
...  

Transient voltages in the power grid are the key for the fault analysis of a power grid, optimized insulation design, and the standardization of the high-voltage testing method. The traditional measuring equipment, based on electrical engineering, normally has a limited bandwidth and response speed, which are also featured by a huge size and heavy weight. In this paper, an integrated optical electric-field sensor based on the Pockels effect was developed and applied to measure the transient voltages on the high-voltage conductors in a non-contact measuring mode. The measuring system has a response speed faster than 6 ns and a wide bandwidth ranging from 5 Hz to 100 MHz. Moreover, the sensors have the dimensions of 18 mm by 18 mm by 48 mm and a light weight of dozens of grams. The measuring systems were employed to monitor the lightning transient voltages on a 220 kV overhead transmission line. The switching transient voltages were also measured by the measuring system during the commissioning of the 500 kV middle Tibet power grid. In 2017, 307 lightning transient voltages caused by induction stroke were recorded. The characteristics of these voltage waveforms are different from the standard lightning impulse voltage proposed by IEC standards. Three types of typical switching transient voltage in 500 kV AC power grid were measured, and the peak values of these overvoltages can reach 1.73 times rated voltage.


Sensors ◽  
2016 ◽  
Vol 16 (6) ◽  
pp. 859 ◽  
Author(s):  
Dongping Xiao ◽  
Huaitong Liu ◽  
Qiang Zhou ◽  
Yutong Xie ◽  
Qichao Ma

2018 ◽  
Vol 57 (22) ◽  
pp. 6456 ◽  
Author(s):  
Matt T. Simons ◽  
Joshua A. Gordon ◽  
Christopher L. Holloway

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