Robust importance sampling for efficient SRAM yield analysis

2010 11th International Symposium on Quality Electronic Design (ISQED) ◽

10.1109/isqed.2010.5450410 ◽

2010 ◽

Author(s):

Takanori Date ◽

Shiho Hagiwara ◽

Kazuya Masu ◽

Takashi Sato

Keyword(s):

Importance Sampling ◽

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Efficient Importance Sampling for High-sigma Yield Analysis with Adaptive Online Surrogate Modeling

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 ◽

10.7873/date.2013.267 ◽

2013 ◽

Author(s):

Jian Yao ◽

Zuochang Ye ◽

Yan Wang

Keyword(s):

Importance Sampling ◽

Surrogate Modeling ◽

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Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation

10.1109/dac18074.2021.9586136 ◽

2021 ◽

Author(s):

Wenfei Hu ◽

Zhikai Wang ◽

Sen Yin ◽

Zuochang Ye ◽

Yan Wang

Keyword(s):

Importance Sampling ◽

Failure Rate ◽

Yield Analysis ◽

Rate Estimation

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Regularized logistic regression for fast importance sampling based SRAM yield analysis

2017 18th International Symposium on Quality Electronic Design (ISQED) ◽

10.1109/isqed.2017.7918303 ◽

2017 ◽

Author(s):

Lama Shaer ◽

Rouwaida Kanj ◽

Rajiv Joshi ◽

Maria Malik ◽

Ali Chehab

Keyword(s):

Logistic Regression ◽

Importance Sampling ◽

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An Efficient SRAM yield Analysis Using Scaled-Sigma Adaptive Importance Sampling

2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) ◽

10.23919/date48585.2020.9116233 ◽

2020 ◽

Author(s):

Liang Pang ◽

Mengyun Yao ◽

Yifan Chai

Keyword(s):

Importance Sampling ◽

Adaptive Importance Sampling ◽

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Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis

2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) ◽

10.1109/iccad.2010.5654259 ◽

2010 ◽

Author(s):

Kentaro Katayama ◽

Shiho Hagiwara ◽

Hiroshi Tsutsui ◽

Hiroyuki Ochi ◽

Takashi Sato

Keyword(s):

Importance Sampling ◽

High Dimensional ◽

Sequential Importance Sampling ◽

Yield Analysis ◽

Low Probability

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An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2020.2966481 ◽

2020 ◽

pp. 1-1

Author(s):

Xiao Shi ◽

Hao Yan ◽

Jinxin Wang ◽

Jiajia Zhang ◽

Longxing Shi ◽

...

Keyword(s):

Importance Sampling ◽

Sampling Method ◽

Adaptive Importance Sampling ◽

Yield Analysis ◽

Importance Sampling Method

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A non-gaussian adaptive importance sampling method for high-dimensional and multi-failure-region yield analysis

Proceedings of the 39th International Conference on Computer-Aided Design ◽

10.1145/3400302.3415633 ◽

2020 ◽

Author(s):

Xiao Shi ◽

Hao Yan ◽

Chuwen Li ◽

Jianli Chen ◽

Longxing Shi ◽

...

Keyword(s):

Importance Sampling ◽

Sampling Method ◽

High Dimensional ◽

Adaptive Importance Sampling ◽

Yield Analysis ◽

Importance Sampling Method ◽

Failure Region ◽

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Hybrid Importance Splitting Importance Sampling Methodology for Fast Yield Analysis of Memory Designs

2020 IEEE International Symposium on Circuits and Systems (ISCAS) ◽

10.1109/iscas45731.2020.9181010 ◽

2020 ◽

Author(s):

Mariam Rakka ◽

Rouwaida Kanj ◽

Ragheb Raad

Keyword(s):

Importance Sampling ◽

Sampling Methodology ◽

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Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method

2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) ◽

10.1109/iccad45719.2019.8942069 ◽

2019 ◽

Author(s):

Xiao Shi ◽

Hao Yan ◽

Jiajia Zhang ◽

Qiancun Huang ◽

Longxing Shi ◽

...

Keyword(s):

Importance Sampling ◽

Analog Circuits ◽

Sampling Method ◽

Yield Analysis ◽

Model Based ◽

Importance Sampling Method

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High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2016.2601606 ◽

2017 ◽

Vol 25 (3) ◽

pp. 806-819 ◽

Author(s):

Mengshuo Wang ◽

Changhao Yan ◽

Xin Li ◽

Dian Zhou ◽

Xuan Zeng

Keyword(s):

Importance Sampling ◽

High Dimensional ◽

Yield Analysis ◽

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