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Efficient Importance Sampling for High-sigma Yield Analysis with Adaptive Online Surrogate Modeling
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
◽
10.7873/date.2013.267
◽
2013
◽
Cited By ~ 8
Author(s):
Jian Yao
◽
Zuochang Ye
◽
Yan Wang
Keyword(s):
Importance Sampling
◽
Surrogate Modeling
◽
Yield Analysis
Download Full-text
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2021
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Author(s):
Wenfei Hu
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Zhikai Wang
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Zuochang Ye
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Yan Wang
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Importance Sampling
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Regularized logistic regression for fast importance sampling based SRAM yield analysis
2017 18th International Symposium on Quality Electronic Design (ISQED)
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10.1109/isqed.2017.7918303
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2017
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Cited By ~ 1
Author(s):
Lama Shaer
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Rouwaida Kanj
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Rajiv Joshi
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Maria Malik
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Keyword(s):
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An Efficient SRAM Yield Analysis and Optimization Method With Adaptive Online Surrogate Modeling
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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pp. 1245-1253
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Cited By ~ 10
Author(s):
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Keyword(s):
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An Efficient SRAM yield Analysis Using Scaled-Sigma Adaptive Importance Sampling
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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10.23919/date48585.2020.9116233
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2020
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Author(s):
Liang Pang
◽
Mengyun Yao
◽
Yifan Chai
Keyword(s):
Importance Sampling
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Adaptive Importance Sampling
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Yield Analysis
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Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis
2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
◽
10.1109/iccad.2010.5654259
◽
2010
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Cited By ~ 35
Author(s):
Kentaro Katayama
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Shiho Hagiwara
◽
Hiroshi Tsutsui
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Hiroyuki Ochi
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Takashi Sato
Keyword(s):
Importance Sampling
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High Dimensional
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Sequential Importance Sampling
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Yield Analysis
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Low Probability
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An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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10.1109/tcad.2020.2966481
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Author(s):
Xiao Shi
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Keyword(s):
Importance Sampling
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Adaptive Importance Sampling
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Yield Analysis
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Importance Sampling Method
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Robust importance sampling for efficient SRAM yield analysis
2010 11th International Symposium on Quality Electronic Design (ISQED)
◽
10.1109/isqed.2010.5450410
◽
2010
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Cited By ~ 8
Author(s):
Takanori Date
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Shiho Hagiwara
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Kazuya Masu
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Keyword(s):
Importance Sampling
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A non-gaussian adaptive importance sampling method for high-dimensional and multi-failure-region yield analysis
Proceedings of the 39th International Conference on Computer-Aided Design
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◽
Author(s):
Xiao Shi
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Hao Yan
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Chuwen Li
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Keyword(s):
Importance Sampling
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Adaptive Importance Sampling
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Hybrid Importance Splitting Importance Sampling Methodology for Fast Yield Analysis of Memory Designs
2020 IEEE International Symposium on Circuits and Systems (ISCAS)
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Author(s):
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Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method
2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
◽
10.1109/iccad45719.2019.8942069
◽
2019
◽
Author(s):
Xiao Shi
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Hao Yan
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Jiajia Zhang
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Qiancun Huang
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Longxing Shi
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Keyword(s):
Importance Sampling
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Sampling Method
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Yield Analysis
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Meta Model
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Model Based
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