An optical in-plane displacement measurement technique with sub-nanometer accuracy based on curve-fitting

Author(s):  
Jaap Kokorian ◽  
Federico Buja ◽  
Urs Staufer ◽  
W. Merlijn van Spengen
1993 ◽  
Vol 32 (31) ◽  
pp. 6387 ◽  
Author(s):  
R. S. Sirohi ◽  
N. Krishna Mohan

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