Analog Circuit Design Strategies for Reliability Tolerance: Planning for Reliability Effects While Designing Circuits in Modern CMOS Technologies

2020 ◽  
Vol 12 (4) ◽  
pp. 79-85
Author(s):  
Maneesha Yellepeddi ◽  
Aditya Kelkar ◽  
Jeffrey Waldrip
Author(s):  
Mohamed B. Elamien ◽  
Brent J. Maundy ◽  
Leonid Belostotski ◽  
Ahmed S. Elwakil

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