Study of Ceramic Capacitor technology link to Electro Chemical Migration in Automotive Electronics

Author(s):  
Szasz Francisc
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1992 ◽  
Vol 38 (1) ◽  
pp. 32 ◽  
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M.H. Westbrook

IEE Review ◽  
1988 ◽  
Vol 34 (5) ◽  
pp. 202
Author(s):  
C.H.G. Mills

2021 ◽  
Vol 16 (4) ◽  
pp. 28-31
Author(s):  
Paul Hansen

IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Deepak M. Mathew ◽  
Hammam Kattan ◽  
Christian Weis ◽  
Jorg Henkel ◽  
Norbert Wehn ◽  
...  

2021 ◽  
Vol 16 (6) ◽  
pp. 24-27
Author(s):  
Paul Hansen

2006 ◽  
Vol 15-17 ◽  
pp. 633-638 ◽  
Author(s):  
Jong Woong Kim ◽  
Hyun Suk Chun ◽  
Sang Su Ha ◽  
Jong Hyuck Chae ◽  
Jin Ho Joo ◽  
...  

Board-level reliability of conventional Sn-37Pb and Pb-free Sn-3.0Ag-0.5Cu solder joints was evaluated using thermal shock testing. In the microstructural investigation of the solder joints, the formation of Cu6Sn5 intermetallic compound (IMC) layer was observed between both solders and Cu lead frame, but any crack or newly introduced defect cannot be found even after 2000 cycles of thermal shocks. Shear test of the multi layer ceramic capacitor (MLCC) joints were also conducted to investigate the effect of microstructural variations on the bonding strength of the solder joints. Shear forces of the both solder joints decreased with increasing thermal shock cycles. The reason to the decrease in shear force was discussed with fracture surfaces of the shear tested solder joints.


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