scholarly journals Numerical analysis of electromigration in thin film VLSI interconnections

Author(s):  
V. Petrescu ◽  
T. Mouthaan ◽  
W. Schoenmaker ◽  
S. Angelescu ◽  
R. Vissarion ◽  
...  
Keyword(s):  
Author(s):  
Sakib Faisal ◽  
Sheikh Ifatur Rahman ◽  
Sarwar Ahmed ◽  
Tanvir Islam Dhrubo

2016 ◽  
Vol 450 ◽  
pp. 66-73 ◽  
Author(s):  
Xue-Feng Han ◽  
Jae-Hak Lee ◽  
Yoo-Jin Lee ◽  
Jae-Ho Song ◽  
Kyung-Woo Yi
Keyword(s):  

2009 ◽  
Vol 10 (1) ◽  
pp. 39-61 ◽  
Author(s):  
Ferhat Hammoum ◽  
Emmanuel Chailleux ◽  
Hoai-Nam Nguyen ◽  
Alain Erhlacher ◽  
Jean-Michel Piau ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document