Numerical analysis of electromigration in thin film VLSI interconnections
V. Petrescu
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T. Mouthaan
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W. Schoenmaker
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S. Angelescu
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R. Vissarion
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...
2012 ◽
Vol E95-C
(1)
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pp. 86-92
Yen-Lin PAN
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Cheng-Chi TAI
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Dong-Shong LIANG
2019 ◽
Vol 75
(1)
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pp. 56-70
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Ritesh Dwivedi
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Pawan Kumar Singh
Sakib Faisal
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Sheikh Ifatur Rahman
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Sarwar Ahmed
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Tanvir Islam Dhrubo
2016 ◽
Vol 450
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pp. 66-73
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Xue-Feng Han
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Jae-Hak Lee
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Yoo-Jin Lee
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Jae-Ho Song
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Kyung-Woo Yi
H. Iwata
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T. Ohzone
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H. Takakura
2020 ◽
Vol 201
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pp. 163496
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Junhui Lin
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Jiaxiong Xu
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Yuanzheng Yang
2009 ◽
Vol 10
(1)
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pp. 39-61
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Ferhat Hammoum
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Emmanuel Chailleux
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Hoai-Nam Nguyen
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Alain Erhlacher
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Jean-Michel Piau
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...
N. A. Khan
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K. S. Rahman
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F. Haque
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N. Dhar
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M. A. Islam
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...