Heat Transfer Analysis of Cu and Al 2 0 3 Dispersed in Ethylene Glycol as a Base Fluid over a Stretchable Permeable Sheet of MHD Thin-film Flow

The process of thin films is commonly utilized to improve the surface characteristics of materials. A thin film helps to improve the absorption, depreciation, flexibility, lighting, transport, and electromagnetic efficiency of a bulk material medium. Thin film treatment can be especially helpful in nanotechnology. As a result, the current study investigates the computational process of heat relocation analysis in a thin-film MHD flow embedded in hybrid nanoparticles, which combines the spherical copper and alumina dispersed in ethylene glycol as the conventional heat transfer Newtonian fluid model over a stretching sheet. Important elements such as thermophoresis and Brownian movement are used to explain the characteristics of heat and mass transfer analysis. Nonlinear higher differential equations (ODEs) were attained by transforming partial differential equations (PDEs) into governing equations when implementing the similarity transformation technique. The resulting nonlinear ODEs have been utilized by using the homotopy analysis method (MHD). The natures of the thin-film flow and heat transfer through the various values of the pertinent parameters: unsteadiness, nanoparticle volume fraction, thin-film thickness, magnetic interaction and intensity suction/injection are deliberated. The approximate consequences for flow rate and temperature distributions and physical quantities in terms of local skin friction and Nusselt number were obtained and analysed via graphs and tables. As a consequence, the suction has a more prodigious effect on the hybrid nanofluid than on the injection fluid for all the investigated parameters. It is worth acknowledging that the existence of the nanoparticles and MHD in the viscous hybrid nanofluid tends to enhance the temperature profile but decay the particle movement in the thin-film flow. It is perceived that the velocity and temperature fields decline with increasing unsteadiness, thin-film thickness and suction/injection parameters.

Current Opportunities and Challenges in Biopolymer Thin Film Analysis—Determination of Film Thickness

Polymer thin films with thickness below 100 nm are a fascinating class of 2D materials with commercial and research applications in many branches ranging from coatings to photoresists and insulating materials, to mention just a few uses. Biopolymers have extended the scope of polymer thin films with unique materials such as cellulose, cellulose nanocrystals, cellulose nanofibrils with tunable water uptake, crystallinity and optical properties. The key information needed in thin biopolymer film use and research is film thickness. It is often challenging to determine precisely and hence several techniques and their combinations are used. Additional challenges with hydrophilic biopolymers such as cellulose are the presence of humidity and the soft and often heterogenous structure of the films. This minireview summarizes currently used methods and techniques for biopolymer thin film thickness analysis and outlines challenges for accurate and reproducible characterization. Cellulose is chosen as the representative biopolymer.

Optimization of Fiber Bragg Gratings Inscribed in Thin Films Deposited on D-Shaped Optical Fibers

A fiber Bragg grating patterned on a SnO2 thin film deposited on the flat surface of a D-shaped polished optical fiber is studied in this work. The fabrication parameters of this structure were optimized to achieve a trade-off among reflected power, full width half maximum (FWHM), sensitivity to the surrounding refractive index (SRI), and figure of merit (FOM). In the first place, the influence of the thin film thickness, the cladding thickness between the core and the flat surface of the D-shaped fiber (neck), and the length of the D-shaped zone over the reflected power and the FWHM were assessed. Reflected peak powers in the range from −2 dB to −10 dB can be easily achieved with FWHM below 100 pm. In the second place, the sensitivity to the SRI, the FWHM, and the FOM were analyzed for variations of the SRI in the 1.33–1.4 range, the neck, and the thin-film thickness. The best sensitivities theoretically achieved for this device are next to 40 nm/RIU, while the best FOM has a value of 114 RIU−1.

Structural and Electrical Specification of ZrO2Nano Thin Film Prepared by PLD

Zirconium dioxide was prepared as a thin film by using pulse laser deposition (PLD).Subsequently, the films had been thermally treated by annealing process at temperature 450 oC. The structural and electrical parameters of thin films were investigated. As-deposited films were amorphous and had a large surface density of ablated particles. The Annealing process resulted change the phase from amorphous to polycrystalline. The X-ray diffraction of all these films has a polycrystalline structure with two different phases named tetragonal and monoclinic. Hall measurements indicate that the charge carriers of all these films were p-type. In addition, the Hall coefficient suffers some change with thin film thickness. The AC results measured showed the films have resistance and capacitance properties. The AC conduction is dominated by hole cattier.

Deformation Property of Dense Oxide Coated Magnesium Alloy Surface

Dense oxide coated AZ 31 magnesium alloy surfaces were uniformly formed using a radio frequency magnetron sputtering method. The magnesium oxide thin film thickness was about 240 nm. XRD results of the film indicated that film of magnesium oxide single phase was deposited. The surface of the film was uniform and no crack was observed. The Vickers hardness measured by the nanoindenter was about Hv80 and Hv200 for the AZ31 substrate and the sample coated with the thin film, respectively. The dynamic hardness of the AZ31 substrate and the sample coated with the thin film were almost the same. In the curve at the time of pressurization, a step was observed in the sample coated with the thin film. On the other hand, many steps were observed in the data curve for the thin film deposited on the glass substrate.