Effects of Substrate Bias With Recording Layer on the Magnetic Properties and Microstructure of Perpendicular Magnetic Recording Media

2013 ◽  
Vol 49 (6) ◽  
pp. 2682-2685
Author(s):  
J. Z. Shi ◽  
W. K. Lim ◽  
W. L. Phyoe ◽  
J. F. Hu ◽  
K. M. Cher ◽  
...  
2010 ◽  
Vol 123-125 ◽  
pp. 27-30 ◽  
Author(s):  
Chih Long Shen ◽  
Po Cheng Kuo ◽  
S.C. Chen ◽  
C.D. Chen ◽  
S.L. Hsu ◽  
...  

The Co3Pt magnetic layer with thickness of 7~28 nm was deposited onto the Pt underlayer. The as-deposited Co3Pt/Pt double-layered films with or without a 5 nm Pt capped layer were annealed at temperatures between 275 and 375 °C in vacuum of 1 mTorr. The influences of process parameters on perpendicular magnetic properties of Co3Pt thin films were investigated. The Co3Pt film with perpendicular coercivity (Hc⊥) value of 3620 Oe and the perpendicular squareness (S⊥) of 0.7 could be achieved from the Co3Pt(18 nm)/Pt(100 nm) double-layered films by annealing at 300°C. Further added Tb30Co70 film on the Co3Pt/Pt double-layered film could greatly enhance the perpendicular magnetic properties of the film. The Hc⊥ and S⊥ of the Tb30Co70/Co3Pt/Pt film were as high as 6560 Oe and 0.88, respectively, which has significant potential to be applied in perpendicular magnetic recording media.


1989 ◽  
Vol 13 (S_1_PMRC_89) ◽  
pp. S1_813-818 ◽  
Author(s):  
Yasuo TATENO ◽  
Kazuharu IWASAKI ◽  
Hiroji NARUSE ◽  
Takuya ITOH ◽  
Ryoji CHUBACHI

1991 ◽  
Vol 15 (S_2_PMRC_91) ◽  
pp. S2_965-970 ◽  
Author(s):  
Tetsuya OSAKA ◽  
Takayuki HOMMA ◽  
Hiroki ASAI ◽  
Ken OHRUI ◽  
Yohtaro YAMAZAKI ◽  
...  

2014 ◽  
Vol 70 (a1) ◽  
pp. C148-C148
Author(s):  
Stephen Lister ◽  
Vikash Venkataramana ◽  
Thomas Thomson ◽  
Joachim Kohlbrecher ◽  
Ken Takano ◽  
...  

The study of thin film magnetic systems that are structured on the nanoscale is an area of intense interest. Small-angle neutron scattering is an extremely powerful probe of nanomagnetism in the bulk, but in thin-film systems the experiments are challenging due both to the small scattering volume available and also to scattering from other sources such as the substrate and sample environment. We have demonstrated that such experiments are however possible in magnetic films as thin as 10 nm. A good example to illustrate this is the case of perpendicular magnetic recording media. These materials are found in all modern magnetic hard drives, the data storage technology that continues to be of tremendous commercial and technological importance. These media are advanced functional multilayered materials, containing an active recording layer of only around 10 nm in thickness. This recording layer is compositionally segregated into 8 nm-sized grains of a magnetic CoCrPt alloy separated by a thin oxide shell, typically SiO2. These media have their magnetic moments oriented perpendicular to the plane of the film. Determining the local magnetic structure and reversal behavior is key to understanding the performance of perpendicular media in recording devices. Polarised SANS has proved to be a very effective tool to measure these materials at a sub-10nm length scales. The signal of interest must however also be distinguished from the scattering from other layers in the structure, some of which are also magnetic. We will present a summary of some recent results on recording media, including measurements of the grain-sized dependent switching with and without the presence of an exchange spring. We will also briefly mention experiments that demonstrate the viability of extending this approach to measurement for lithographically defined structures similar to those for application in bit-patterned media, including 2d artificial spin-ice and structurally glassy arrays.


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