Bayesian reliability assessment of electronic equipment under fuzzy sample information

Author(s):  
Yin Zong-run ◽  
Li Jun-shan
Author(s):  
Lloyd Condra ◽  
Cosimo Bosco ◽  
Robert Deppe ◽  
Louis Gullo ◽  
James Treacy ◽  
...  

Optimization ◽  
1976 ◽  
Vol 7 (5) ◽  
pp. 665-672
Author(s):  
H. Burke ◽  
C. Hennig ◽  
W H. Schmidt

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