Observation of Radiation-Induced Leakage Current Defects in MOS Oxides With Multifrequency Electrically Detected Magnetic Resonance and Near-Zero-Field Magnetoresistance

2020 ◽  
Vol 67 (1) ◽  
pp. 228-233
Author(s):  
Stephen J. Moxim ◽  
James P. Ashton ◽  
Patrick M. Lenahan ◽  
Michael E. Flatte ◽  
Nicholas J. Harmon ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Leakage Current ◽  
Zero Field ◽  
Electrically Detected Magnetic Resonance ◽  
Radiation Induced

Modeling of Near Zero-Field Magnetoresistance and Electrically Detected Magnetic Resonance in Irradiated Si/SiO2 MOSFETs

2020 ◽  
Vol 67 (7) ◽  
pp. 1669-1673
Author(s):  
Nicholas J. Harmon ◽  
Stephen R. Mcmillan ◽  
James P. Ashton ◽  
Patrick M. Lenahan ◽  
Michael E. Flatte
Keyword(s):  
Magnetic Resonance ◽  
Zero Field ◽  
Electrically Detected Magnetic Resonance

Electrically detected magnetic resonance and near-zero field magnetoresistance in 28Si/28SiO2

2021 ◽  
Vol 130 (6) ◽  
pp. 065701
Author(s):  
Elias B. Frantz ◽  
David J. Michalak ◽  
Nicholas J. Harmon ◽  
Eric M. Henry ◽  
Stephen J. Moxim ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Zero Field ◽  
Electrically Detected Magnetic Resonance

C-Face Interface Defects in 4H-SiC MOSFETs Studied by Electrically Detected Magnetic Resonance

2014 ◽  
Vol 778-780 ◽  
pp. 414-417 ◽  
Author(s):  
Takahide Umeda ◽  
Mitsuo Okamoto ◽  
Ryo Arai ◽  
Yoshihiro Satoh ◽  
Ryouji Kosugi ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Interface Defects ◽  
Electrically Detected Magnetic Resonance

This paper reports an EDMR (electrically detected magnetic resonance) observation on 4H-SiC(000-1) “C face” MOSFETs. We found a new strong EDMR signal in wet-oxidized C-face 4H-SiC MOSFETs, which originates from intrinsic interface defects on C-face SiC-SiO2 structures.

Recombination centers inGaAs/Al0.4Ga0.6Asheterostructures investigated by optically and electrically detected magnetic resonance

1998 ◽  
Vol 58 (8) ◽  
pp. 4892-4902 ◽  
Author(s):  
T. Wimbauer ◽  
M. S. Brandt ◽  
M. W. Bayerl ◽  
N. M. Reinacher ◽  
M. Stutzmann ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Electrically Detected Magnetic Resonance ◽  
Recombination Centers

scholarly journals Electrically Detected Magnetic Resonance of Donors and Interfacial Defects in Silicon Nanowires

2011 ◽  
Vol 3 (4) ◽  
pp. 568-574 ◽  
Author(s):  
M. Fanciulli ◽  
A. Vellei ◽  
C. Canevali ◽  
S. Baldovino ◽  
G. Pennelli ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Silicon Nanowires ◽  
Interfacial Defects ◽  
Electrically Detected Magnetic Resonance
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