stress induced leakage current
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New Statistical Data and Modeling of Stress-Induced Leakage Current in 3D-NAND Floating Gate Non-Volatile Flash Memories

2021 ◽  
pp. 1-1
Author(s):  
Andrea Chimenton ◽  
Neal R. Mielke ◽  
Eunhwan Cho ◽  
Ivan Kalastirsky
Keyword(s):  
Leakage Current ◽  
Statistical Data ◽  
Floating Gate ◽  
Flash Memories ◽  
Stress Induced Leakage Current

Stress-Induced Leakage Current in Magnetic Tunnel Junctions with Thin AlOx Barrier

2019 ◽  
Vol 6 (3) ◽  
pp. 343-354
Author(s):  
Tadashi Mihara ◽  
Yoshinari Kamakura ◽  
Masato Morifuji ◽  
Kenji Taniguchi
Keyword(s):  
Leakage Current ◽  
Tunnel Junctions ◽  
Magnetic Tunnel Junctions ◽  
Stress Induced Leakage Current

Stress-Induced Leakage Current and Charge Trapping in Cerium Dioxide Thin Film

2019 ◽  
Vol 33 (3) ◽  
pp. 551-556 ◽  
Author(s):  
Fu-Chien Chiu ◽  
S. H. Chang
Keyword(s):  
Thin Film ◽  
Leakage Current ◽  
Cerium Dioxide ◽  
Charge Trapping ◽  
Stress Induced Leakage Current

Mechanism of stress induced leakage current in Si3N4

2019 ◽  
Vol 6 (7) ◽  
pp. 076401
Author(s):  
V A Gritsenko ◽  
A A Gismatulin ◽  
A P Baraban ◽  
A Сhin
Keyword(s):  
Leakage Current ◽  
Stress Induced Leakage Current

Experimental investigation of localized stress-induced leakage current distribution in gate dielectrics using array test circuit

2018 ◽  
Vol 57 (4S) ◽  
pp. 04FE11
Author(s):  
Hyeonwoo Park ◽  
Akinobu Teramoto ◽  
Rihito Kuroda ◽  
Tomoyuki Suwa ◽  
Shigetoshi Sugawa
Keyword(s):  
Experimental Investigation ◽  
Leakage Current ◽  
Current Distribution ◽  
Gate Dielectrics ◽  
Test Circuit ◽  
Stress Induced Leakage Current

Stress-induced leakage current characteristics of PMOS fabricated by a new multi-deposition multi-annealing technique with full gate last process

2017 ◽  
Vol 26 (8) ◽  
pp. 087304
Author(s):  
Yanrong Wang ◽  
Hong Yang ◽  
Hao Xu ◽  
Weichun Luo ◽  
Luwei Qi ◽  
...  
Keyword(s):  
Leakage Current ◽  
Stress Induced Leakage Current ◽  
Current Characteristics

scholarly journals Mechanism of charge transport of stress induced leakage current and trap nature in thermal oxide on silicon

2017 ◽  
Vol 864 ◽  
pp. 012003 ◽  
Author(s):  
Damir R Islamov ◽  
V A Gritsenko ◽  
T V Perevalov ◽  
O M Orlov ◽  
G Ya Krasnikov
Keyword(s):  
Charge Transport ◽  
Leakage Current ◽  
Thermal Oxide ◽  
Stress Induced Leakage Current

The Impact of AlN Spacer on Forward Gate Current and Stress-Induced Leakage Current (SILC) of GaN HEMT

2016 ◽  
Author(s):  
Chung-hsu Chen ◽  
Dave Wang ◽  
Daniel Hou ◽  
Yuefei Yang ◽  
Wing Yau ◽  
...  
Keyword(s):  
Leakage Current ◽  
Gate Current ◽  
Gan Hemt ◽  
Stress Induced Leakage Current ◽  
The Impact

Charge Transport Mechanism of Stress Induced Leakage Current in Thermal Silicon Oxide

2016 ◽  
Vol 75 (5) ◽  
pp. 57-62
Author(s):  
D. R. Islamov ◽  
V. A. Gritsenko ◽  
T. V. Perevalov ◽  
O. M. Orlov ◽  
G. J. Krasnikov
Keyword(s):  
Charge Transport ◽  
Leakage Current ◽  
Transport Mechanism ◽  
Silicon Oxide ◽  
Charge Transport Mechanism ◽  
Stress Induced Leakage Current
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