Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs With Comparison to 20-nm Planar SRAMs

2020 ◽  
Vol 67 (7) ◽  
pp. 1485-1493
Author(s):  
Takashi Kato ◽  
Masanori Hashimoto ◽  
Hideya Matsuyama
Keyword(s):  
Single Event ◽  
Angular Sensitivity ◽  
Single Event Upsets ◽  
20 Nm

Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles

2021 ◽  
pp. 1-1
Author(s):  
Takashi Kato ◽  
Motonobu Tampo ◽  
Soshi Takeshita ◽  
Hiroki Tanaka ◽  
Hideya Matsuyama ◽  
...  
Keyword(s):  
Alpha Particles ◽  
Single Event ◽  
Comparative Characterization ◽  
Single Event Upsets ◽  
20 Nm

Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs

2005 ◽  
Vol 52 (6) ◽  
pp. 2319-2325 ◽  
Author(s):  
J. Baggio ◽  
V. Ferlet-Cavrois ◽  
D. Lambert ◽  
P. Paillet ◽  
F. Wrobel ◽  
...  
Keyword(s):  
Single Event ◽  
Fully Depleted ◽  
Single Event Upsets

Single event upsets in gallium arsenide dynamic logic

1994 ◽  
Vol 41 (6) ◽  
pp. 2244-2251 ◽  
Author(s):  
D.J. Fouts ◽  
T. Weatherford ◽  
D. McMorrow ◽  
J.S. Melinger ◽  
A.B. Campbell
Keyword(s):  
Gallium Arsenide ◽  
Dynamic Logic ◽  
Single Event ◽  
Single Event Upsets

(Invited) Total Dose Effects and Single Event Upsets During Radiation Damage of GaN and SiC

2021 ◽  
Vol 104 (7) ◽  
pp. 13-34
Author(s):  
Ani Khachatrian ◽  
Adrian Ildefonso ◽  
Zahabul Islam ◽  
Md Abu Jafar Rasel ◽  
Amanul Haque ◽  
...  
Keyword(s):  
Total Dose ◽  
Radiation Damage ◽  
Single Event ◽  
Single Event Upsets ◽  
Dose Effects ◽  
Total Dose Effects

Role of Elastic Scattering of Protons, Muons, and Electrons in Inducing Single-Event Upsets

2017 ◽  
Vol 64 (10) ◽  
pp. 2648-2660 ◽  
Author(s):  
Avraham Akkerman ◽  
Joseph Barak ◽  
Nir M. Yitzhak
Keyword(s):  
Elastic Scattering ◽  
Single Event ◽  
Single Event Upsets
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