2011 IEEE Radiation Effects Data Workshop
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9781457712814
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Total Dose Test Results for CubeSat Electronics

2011 ◽  
Author(s):  
Keith Avery ◽  
Jeffery Finchel ◽  
Jesse Mee ◽  
William Kemp ◽  
Richard Netzer ◽  
...  
Keyword(s):  
Total Dose ◽  
Test Results

scholarly journals Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories

2011 ◽  
Author(s):  
Timothy R. Oldham ◽  
Melanie Berg ◽  
Mark Friendlich ◽  
Ted Wilcox ◽  
Christina Seidleck ◽  
...  
Keyword(s):  
Ion Irradiation ◽  
Heavy Ion ◽  
Nand Flash ◽  
Flash Memories ◽  
Heavy Ion Irradiation

130nm Single Event Upset Performance Evaluation: Commercial vs. Hardened by Design Architectures

2011 ◽  
Author(s):  
Radu Dumitru ◽  
Craig Hafer ◽  
Tzu-Wen Wu ◽  
Rob Rominger ◽  
Peter Milliken ◽  
...  
Keyword(s):  
Performance Evaluation ◽  
Single Event Upset ◽  
Single Event

scholarly journals Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

2011 ◽  
Author(s):  
Martha V. O'Bryan ◽  
Kenneth A. LaBel ◽  
Jonathan A. Pellish ◽  
Jean-Marie Lauenstein ◽  
Dakai Chen ◽  
...  
Keyword(s):  
Space Systems ◽  
Single Event ◽  
Single Event Effects

Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

2011 ◽  
Author(s):  
Craig Hafer ◽  
Mike Lahey ◽  
Debra Harris ◽  
Jennifer Larsen ◽  
Fred Sievert ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Single Event ◽  
Single Event Effects ◽  
Wafer Fab
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