Automatic Generation of Floating-Point Test Data

1976 ◽  
Vol SE-2 (3) ◽  
pp. 223-226 ◽  
Author(s):  
W. Miller ◽  
D.L. Spooner
Author(s):  
Laura Titolo ◽  
Mariano Moscato ◽  
Marco A. Feliu ◽  
César A. Muñoz

2013 ◽  
Vol 709 ◽  
pp. 616-619
Author(s):  
Jing Chen

This paper proposes a genetic algorithm-based method to generate test cases. This method provides information for test case generation using state machine diagrams. Its feature is realizing automation through fewer generated test cases. In terms of automatic generation of test data based on path coverage, the goal is to build a function that can excellently assess the generated test data and guide the genetic algorithms to find the targeting parameter values.


Author(s):  
Chu Thi Minh Hue ◽  
Duc-Hanh Dang ◽  
Nguyen Ngoc Binh ◽  
Anh-Hoang Truong

This paper proposes a transformation-based method to automatically generate functional test cases from use cases named USLTG (Use case Specification Language (USL)-based Test Generation). We first focus on developing a modeling language named Test Case Specification Language (TCSL) in order to express test cases. Test cases in TCSL can contain detailed information including test steps, test objects within steps, actions of test objects, and test data. Such information is often ignored in currently available test case specifications. We then aim to generate test cases in a TCSL model by a transformation from use cases that are represented by a USL. The USLTG transformation includes three main steps in generating (1) scenarios, (2) test data, and (3) a TCSL model. Within our transformation, the OCL solver is employed in order to build system snapshots as the part of test cases and to identify other test data. We applied our method to two case studies and evaluated our method by comparing it with other recent works.


2014 ◽  
Vol 2014 ◽  
pp. 1-7 ◽  
Author(s):  
Hai-feng Wu ◽  
Yu-sheng Cheng ◽  
Wen-fa Zhan ◽  
Yi-fei Cheng ◽  
Qiong Wu ◽  
...  

Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point numbers, stored in the form of irrational numbers. The algorithm of converting floating-point number to irrational number precisely is given. Experimental results for some ISCAS 89 benchmarks show that the compression effect of proposed scheme is better than the coding methods such as FDR, AARLC, INDC, FAVLC, and VRL.


1987 ◽  
Vol 30 (1) ◽  
pp. 63-69 ◽  
Author(s):  
D. C. Ince

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