Flip-flop clustering based trace signal selection for post-silicon debug

2017 IEEE 35th VLSI Test Symposium (VTS) ◽

10.1109/vts.2017.7928929 ◽

2017 ◽

Author(s):

Yun Cheng ◽

Huawei Li ◽

Ying Wang ◽

Yingke Gao ◽

Bo Liu ◽

...

Keyword(s):

Flip Flop ◽

Signal Selection ◽

Selection For ◽

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Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2018.2818690 ◽

2019 ◽

Vol 38 (4) ◽

pp. 767-779 ◽

Author(s):

Yun Cheng ◽

Huawei Li ◽

Ying Wang ◽

Xiaowei Li

Keyword(s):

Signal Selection ◽

Selection For ◽

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Efficient Trace Signal Selection for Silicon Debug by Error Transmission Analysis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2171184 ◽

2012 ◽

Vol 31 (3) ◽

pp. 442-446 ◽

Author(s):

Joon-Sung Yang ◽

Nur A. Touba

Keyword(s):

Signal Selection ◽

Selection For ◽

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Simulation-based signal selection for state restoration in silicon debug

2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) ◽

10.1109/iccad.2011.6105391 ◽

2011 ◽

Author(s):

Debapriya Chatterjee ◽

Calvin McCarter ◽

Valeria Bertacco

Keyword(s):

Signal Selection ◽

Simulation Based ◽

Selection For ◽

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Multi-mode trace signal selection for post-silicon debug

2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2014.6742963 ◽

2014 ◽

Author(s):

Min Li ◽

Azadeh Davoodi

Keyword(s):

Signal Selection ◽

Selection For ◽

Silicon Debug ◽

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Simultaneous signal selection for silicon debug through Mixed-Integer Linear Programming

2016 International Conference on Emerging Trends in Engineering, Technology and Science (ICETETS) ◽

10.1109/icetets.2016.7603063 ◽

2016 ◽

Author(s):

R. Agalya ◽

S. Saravanan

Keyword(s):

Linear Programming ◽

Integer Linear Programming ◽

Mixed Integer Linear Programming ◽

Mixed Integer ◽

Signal Selection ◽

Selection For ◽

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A Hybrid Approach for Fast and Accurate Trace Signal Selection for Post-Silicon Debug

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 ◽

10.7873/date.2013.111 ◽

2013 ◽

Author(s):

Min Li ◽

Azadeh Davoodi

Keyword(s):

Hybrid Approach ◽

Signal Selection ◽

Selection For ◽

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A Hybrid Approach for Fast and Accurate Trace Signal Selection for Post-Silicon Debug

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2014.2307533 ◽

2014 ◽

Vol 33 (7) ◽

pp. 1081-1094 ◽

Author(s):

Min Li ◽

Azadeh Davoodi

Keyword(s):

Hybrid Approach ◽

Signal Selection ◽

Selection For ◽

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Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2008.2009158 ◽

2009 ◽

Vol 28 (2) ◽

pp. 285-297 ◽

Author(s):

Ho Fai Ko ◽

N. Nicolici

Keyword(s):

Data Acquisition ◽

Signal Selection ◽

Selection For ◽

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Scalable Signal Selection for Post-Silicon Debug

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2012.2202409 ◽

2013 ◽

Vol 21 (6) ◽

pp. 1103-1115 ◽

Author(s):

Eddie Hung ◽

Steven J. E. Wilton

Keyword(s):

Signal Selection ◽

Selection For ◽

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Feature-based Signal Selection for Post-silicon Debug using Machine Learning

IEEE Transactions on Emerging Topics in Computing ◽

10.1109/tetc.2017.2787610 ◽

2017 ◽

pp. 1-1 ◽

Author(s):

Kamran Rahmani ◽

Prabhat Mishra

Keyword(s):

Machine Learning ◽

Signal Selection ◽

Feature Based ◽

Selection For ◽

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