Automatic Determination of the Small Displacements in a Mechanical Assembly of Two Parts

Author(s):  
Charles Forster ◽  
Emmanuel Doré

Abstract Herein is proposed an automatic method by which the precision of a joint realized by the mechanical assembly of two parts may be totally determined. This precision depends on the dimensional and geometrical defaults existing in the parts, and is materialized by additional small displacements of the parts superposed with the kinematics of the joint. In a first step, the parts are represented by their geometrical entities, and the possible contacts existing between these entities. By ≪ sliding ≫ the parts around their nominal position, i.e. by opening or closing contacts between surfaces, one defines a new configuration of the assembly. In a second step, we give the conditions that this new configuration must fulfill to be physically acceptable. No parasitical motion is accepted, it must be possible to compute the small displacement torsor between the two configurations. And finally, no geometrical interferences are tolerated between the parts. In a third step, we apply this method on a simple but instructive bidimensional example.

Author(s):  
Charles Forster ◽  
Jean-Paul Boufflet ◽  
Fabien Lecouvreur

Abstract Herein is proposed an automatic method by which the all-tolerance chains of a mechanical assembly may be constructed. The method, implementable in a CAD system, is divided into two main steps. In the first step, we model the mechanical assembly with a graph, of which the vertices represent the parts and the edges, the contact between the parts. By « sliding » the parts, we may determine all the configurations of the mechanical assembly. The proposed model, which uses classical algorithms of the graph theory, allows control of the coherence of the mechanical assembly. In the second step, we introduce an extended syntax by which the functional constraints may be decoded without ambiguity. Then, using the syntax and the model, we show how to construct the tolerance chain for each functional constraint.


2000 ◽  
Vol 28 (1-2) ◽  
pp. 237-245 ◽  
Author(s):  
Nasser Hosseini ◽  
Blanka Hejdukova ◽  
Pall E. Ingvarsson ◽  
Bo Johnels ◽  
Torsten Olsson

Author(s):  
Romain Desplats ◽  
Timothee Dargnies ◽  
Jean-Christophe Courrege ◽  
Philippe Perdu ◽  
Jean-Louis Noullet

Abstract Focused Ion Beam (FIB) tools are widely used for Integrated Circuit (IC) debug and repair. With the increasing density of recent semiconductor devices, FIB operations are increasingly challenged, requiring access through 4 or more metal layers to reach a metal line of interest. In some cases, accessibility from the front side, through these metal layers, is so limited that backside FIB operations appear to be the most appropriate approach. The questions to be resolved before starting frontside or backside FIB operations on a device are: 1. Is it do-able, are the metal lines accessible? 2. What is the optimal positioning (e.g. accessing a metal 2 line is much faster and easier than digging down to a metal 6 line)? (for the backside) 3. What risk, time and cost are involved in FIB operations? In this paper, we will present a new approach, which allows the FIB user or designer to calculate the optimal FIB operation for debug and IC repair. It automatically selects the fastest and easiest milling and deposition FIB operations.


2017 ◽  
Vol 80 (16-18) ◽  
pp. 932-940 ◽  
Author(s):  
Raymond Nepstad ◽  
Emlyn Davies ◽  
Dag Altin ◽  
Trond Nordtug ◽  
Bjørn Henrik Hansen

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