Noise and Contact in Dynamic AFM Operations
In this article, the authors study the effects of Gaussian white noise on the dynamics of an atomic force microscope (AFM) cantilever operating in a dynamic mode by using a combination of numerical and analytical efforts. As a representative system, a combination of Si cantilever and HOPG sample is used. The focus of this study is on understanding the stochastic dynamics of a micro-cantilever, when the excitation frequencies are away from the first natural frequency of the system. In the previous efforts of the authors, period-doubling bifurcations close to grazing impacts have been reported for micro-cantilevers when the excitation frequency is in between the first and the second natural frequencies of the system. In the present study, it is observed that the addition of Gaussian white noise along with a harmonic excitation produces a near-grazing contact, when there was previously no contact between the tip and the sample with only the harmonic excitation. Moment evolution equations derived from a Fokker-Planck system are used to obtain numerical results, which support the statement that the addition of noise facilitates contact between the tip and the sample.